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N3600L
N3600L Process Geometry
Features
• Low Noise: 0.5 nV/√H...
InterFET
Product Folder
Technical Support
Order Now
N3600L
N3600L Process Geometry
Features
Low Noise: 0.5 nV/√Hz Typical Typical Breakdown Voltage: -22V Low On Resistance: 2.0Ω Typical Die Size: 1838um X 1838um X 203um Oversized Bond Pads Substrate Connected to Gate Au Back-Side Finish
Applications
Large Capacitance Detector Pre-Amplifier Matched Pair Applications Custom Part Options
Description
The InterFET N3600L Geometry is ideal for low noise high gain applications.
Geometry Top View
S-D
S-D S-D G
3600
G D-S D-S
D-S
Standard Parts
IF3601 IF3602
Product Summary
Parameters
BVGSS Gate to Source Breakdown Voltage
IDSS Drain to Source Saturation Current
VGS(off) Gate to Source Cutoff Voltage
GFS
Forward Transconductance
Min
Typ
Max
Unit
-15
-22
V
50
1000
mA
-0.5
-3
V
750
mS
Maximum Ratings (@ TA = 25°C, Unless otherwise specified)
Parameters
Min
Typ
Max
Unit
VRGS Reverse Gate to Source or Drain Voltage
-15
-22
V
IFG Continuous Forward Gate Current
10
mA
TJ Operating Junction Temperature
-55
150
°C
TSTG Storage Temperature
-65
175
°C
Disclaimer: It is the Buyers responsibility for designing, validating and testing the end application under all field use cases and extreme use conditions. Guaranteeing the application meets required standards,
regulatory compliance, and all safety and security requirements is the responsibility of the Buyer. These resources are subject to change without notice.
IF355...