HEX INVERTER
SN74HCT04ĆEP HEX INVERTER
D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Enhanced Diminishing M...
Description
SN74HCT04ĆEP HEX INVERTER
D Controlled Baseline
− One Assembly/Test Site, One Fabrication Site
D Enhanced Diminishing Manufacturing
Sources (DMS) Support
D Enhanced Product-Change Notification D Qualification Pedigree† D Operating Voltage Range of 4.5 V to 5.5 V D Outputs Can Drive Up To 10 LSTTL Loads
† Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SCLS561 − JANUARY 2004
D Low Power Consumption, 20-µA Max ICC D Typical tpd = 13 ns D ±4-mA Output Drive at 5 V D Low Input Current of 1 µA Max D Inputs Are TTL-Voltage Compatible
D PACKAGE (TOP VIEW)
1A 1 1Y 2 2A 3 2Y 4 3A 5 3Y 6 GND 7
14 VCC 13 6A 12 6Y 11 5A 10 5Y 9 4A 8 4Y
description/ordering information This device contains six independent inverters. It performs the Boolean function Y = A in positive logic.
ORDERING INFORMATION
TA
PACKAGE‡
ORDERABLE PART NUMBER
TOP-SIDE MARKING
−40°C to 85°C SOIC − D
Reel of 2500 SN74HCT04IDREP
SHCT04IEP
‡ Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at www.ti.com/sc/package.
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