DIGITAL-TO-ANALOG CONVERTER. DAC7664 Datasheet

DAC7664 CONVERTER. Datasheet pdf. Equivalent

Part DAC7664
Description DIGITAL-TO-ANALOG CONVERTER
Feature DAC7664 16ĆBit, Quad Voltage Output DigitalĆtoĆAnalog Converter SBAS271 − MARCH 2004 FEATURES D L.
Manufacture Burr-Brown
Datasheet
Download DAC7664 Datasheet



DAC7664
DAC7664
16ĆBit, Quad Voltage Output
DigitalĆtoĆAnalog Converter
SBAS271 − MARCH 2004
FEATURES
D Low Glitch: 1nV-s (typ)
D Low Power: 18mW
D Unipolar or Bipolar Operation
D Settling Time: 12µs to 0.003%
D 16-Bit Linearity and Monotonicity:
–40°C to +85°C
D Programmable Reset to Mid-Scale or
Zero-Scale
D Data Readback
D Double-Buffered Data Inputs
D Internal Bandgap Voltage Reference
D Power-On Reset
D 3V to 5V Logic Interface
APPLICATIONS
D Process Control
D Closed-Loop Servo Control
D Motor Control
D Data Acquisition Systems
D DAC-per-Pin Programmers
DB0−DB15
DESCRIPTION
The DAC7664 is a 16-bit, quad voltage output
digital-to-analog converter (DAC) with 16-bit monotonic
performance over the specified temperature range. It
accepts 16-bit parallel input data, has double-buffered
DAC input logic (allowing simultaneous update of all
DACs), and provides a readback mode of the internal input
registers. Programmable asynchronous reset clears all
registers to a mid-scale code of 8000h or to a zero-scale
of 0000h. The DAC7664 can operate from a single +5V
supply or from +5V and −5V supplies.
Low power and small size per DAC make the DAC7664
ideal for automatic test equipment, DAC-per-pin
programmers, data acquisition systems, and closed-loop
servo control. The DAC7664 is available in an LQFP-64
package and is specified for operation over the −40°C to
+85°C temperature range.
V
DD
V
SS
V
CC
DAC7664
Data
Latch
Input
Register A
VR EFH A and B
VR EFL A and B
Bandgap
Voltage Reference
DAC
Register A
DAC A
VR E F
VO U TA Sense 2
VO U TA Sense 1
VO U TA
OFSR2A
OFSR1A
Input
Register B
DAC
Register B
DAC B
VR E F
VO U TB Sense 2
VO U TB Sense 1
VO U TB
OFSR2B
OFSR1B
A0
A1
CS
RST
RSTSEL
LDAC
R/W
Control
Logic
Input
Register C
Input
Register D
DAC
Register C
DAC
Register D
VR E FL C
and D
VREFH C
and D
DAC C
VR E F
DAC D
VR E F
VO U TC Sense 2
VO U TC Sense 1
VO U TC
OFSR2C
OFSR1C
VO U TD Sense 2
VO U TD Sense 1
VO U TD
OFSR2D
OFSR1D
AGND
DGND
This device has ESD-CDM sensitivity and special handling precautions must be taken.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright 2004, Texas Instruments Incorporated
www.ti.com



DAC7664
DAC7664
SBAS271 − MARCH 2004
www.ti.com
ORDERING INFORMATION(1)
PRODUCT PACKAGE−LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT
MEDIA, QUANTITY
DAC7664Y
LQFP−64
DAC7664YT
Tape and Reel, 250
PM
−40°C to +85°C DAC7664Y
DAC7664YR Tape and Reel, 1500
DAC7664YB
LQFP−64
DAC7664YBT Tape and Reel, 250
PM
−40°C to +85°C DAC7664YB
DAC7664YBR Tape and Reel, 1500
DAC7664YC
LQFP−64
DAC7664YCT Tape and Reel, 250
PM
−40°C to +85°C DAC7664YC
DAC7664YCR Tape and Reel, 1500
(1) For the most current package and ordering information, see the Package Option Addendum located at the end of this data sheet.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
DAC7664
UNIT
IOVDD, VCC and VDD to VSS
−0.3 to 11
V
IOVDD, VCC and VDD to GND
−0.3 to 5.5
V
Digital Input Voltage to GND
−0.3 to VDD + 0.3
V
Digital Output Voltage to GND
−0.3 to VDD + 0.3
V
ESD-CDM
200
V
Maximum Junction Temperature
+150
°C
Operating Temperature Range
−40 to +85
°C
Storage Temperature Range
−65 to +125
°C
Lead Temperature (soldering, 10s)
+300
°C
(1) Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to
absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond
those specified is not implied.
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
2







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