DIGITAL-TO-ANALOG CONVERTER. DAC7654 Datasheet

DAC7654 CONVERTER. Datasheet pdf. Equivalent

Part DAC7654
Description DIGITAL-TO-ANALOG CONVERTER
Feature DAC7654 SBAS263A − NOVEMBER 2003 − REVISED DECEMBER 2005 16ĆBit, Quad Voltage Output DigitalĆtoĆAna.
Manufacture Burr-Brown
Datasheet
Download DAC7654 Datasheet



DAC7654
DAC7654
SBAS263A − NOVEMBER 2003 − REVISED DECEMBER 2005
16ĆBit, Quad Voltage Output
DigitalĆtoĆAnalog Converter
FEATURES
DESCRIPTION
D Low Glitch: 1nV-s (typ)
D Low Power: 18mW
D Unipolar or Bipolar Operation
D Settling Time: 12µs to 0.003%
D 16-Bit Linearity and Monotonicity:
–40°C to +85°C
D Programmable Reset to Mid-Scale or
Zero-Scale
D Double-Buffered Data Inputs
D Internal Bandgap Voltage Reference
D Power-On Reset
D 3V to 5V Logic Interface
APPLICATIONS
The DAC7654 is a 16-bit, quad voltage output,
digital-to-analog converter (DAC) with 16-bit monotonic
performance over the specified temperature range. It
accepts 24-bit serial input data, has double-buffered DAC
input logic (allowing simultaneous update of all DACs),
and provides a serial data output for daisy-chaining
multiple DACs. Programmable asynchronous reset clears
all registers to a mid-scale code of 8000h or to a zero-scale
of 0000h. The DAC7654 can operate from a single +5V
supply or from +5V and –5V supplies.
Low power and small size per DAC make the DAC7654
ideal for automatic test equipment, DAC-per-pin
programmers, data acquisition systems, and closed-loop
servo-control. The DAC7654 is available in an LQFP
package and is specified for operation over the –40°C to
+85°C temperature range.
D Process Control
D Closed-Loop Servo-Control
D Motor Control
D Data Acquisition Systems
D DAC-per-Pin Programmers
D AC 76 54
IO V D D
V DD
V SS
VCC
VREFH A and B
Bandgap
Voltage Reference
VREFL
VREFH
VREFL A and B
SDI
SDO
Shift
Register
Input
Register A
DAC
Register A
Input
Register B
DAC
Register B
DAC A
DAC B
VOUTA Sense 2
VOUTA Sense 1
VOUTA
OFSR1A
OFSR2A
VOUTB Sense 2
VOUTB Sense 1
VOUTB
CS
CLOCK
RST
RSTSEL
LDAC
LOAD
Control
Logic
Input
Register C
Input
Register D
DAC
Register C
DAC
Register D
DAC C
DAC D
OFSR1B
OFSR2B
VOUTC Sense 2
VOUTC Sense 1
VOUTC
OFSR1C
OFSR2C
VOUTD Sense 2
VOUTD Sense 1
VOUTD
OFSR1D
OFSR2D
VREFL C and D
VREFH C and D
A GND
D GND
This device has ESD-CDM sensitivity and special handling precautions must be taken.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments
semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date. Products
conform to specifications per the terms of Texas Instruments standard warranty.
Production processing does not necessarily include testing of all parameters.
Copyright 2003 − 2005, Texas Instruments Incorporated
www.ti.com



DAC7654
DAC7654
SBAS263A − NOVEMBER 2003 − REVISED DECEMBER 2005
www.ti.com
ORDERING INFORMATION(1)
PRODUCT PACKAGE−LEAD
PACKAGE
DESIGNATOR
SPECIFIED
TEMPERATURE
RANGE
PACKAGE
MARKING
ORDERING
NUMBER
TRANSPORT
MEDIA, QUANTITY
DAC7654Y
LQFP−64
DAC7654YT
Tape and Reel, 250
PM
−40°C to +85°C DAC7654Y
DAC7654YR Tape and Reel, 1500
DAC7654YB
LQFP−64
DAC7654YBT Tape and Reel, 250
PM
−40°C to +85°C DAC7654YB
DAC7654YBR Tape and Reel, 1500
DAC7654YC
LQFP−64
DAC7654YCT Tape and Reel, 250
PM
−40°C to +85°C DAC7654YC
DAC7654YCR Tape and Reel, 1500
(1) For the most current specification and package information, see the Package Ordering Addendum at the end of this data sheet.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range unless otherwise noted(1)
DAC7654
UNIT
IOVDD, VCC and VDD to VSS
−0.3 to 11
V
IOVDD, VCC and VDD to GND
−0.3 to 5.5
V
Digital Input Voltage to GND
−0.3 to VDD + 0.3
V
Digital Output Voltage to GND
−0.3 to VDD + 0.3
V
ESD-CDM
200
V
Maximum Junction Temperature
+150
°C
Operating Temperature Range
−40 to +85
°C
Storage Temperature Range
−65 to +125
°C
Lead Temperature (soldering, 10s)
+300
°C
(1) Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Exposure to
absolute maximum conditions for extended periods may degrade
device reliability. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond
those specified is not implied.
This integrated circuit can be damaged by ESD. Texas
Instruments recommends that all integrated circuits be
handled with appropriate precautions. Failure to observe
proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to
complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could
cause the device not to meet its published specifications.
2







@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)