SN74AHC04-EP

SN74AHC04ĆEP HEX INVERTER D Controlled Baseline − One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D EPIC (Enhanced-Performance Implanted CMOS) Process D Operating Range 2-V to 5.5-V VCC D ESD Protection Exceeds 1500 V Per MIL-STD-833, Method 3015; Exceeds 150 V Using Machine Model (C = 200 pF, R = 0) † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SCLS483A − JUNE 2003 − REVISED SEPTEMBER 2003 D OR PW PACKAGE (TOP VIEW) 1A 1 1Y 2 2A 3 2Y 4 3A 5 3Y 6 GND 7 14 VCC 13 6A 12 6Y 11 5A 10 5Y 9 4A 8 4Y description/ordering information The SN74AHC04 contains six independent inverters. This device performs the Boolean function Y = A. ORDERING INFORMATION TA PACKAGE‡ ORDERABLE PART NUMBER TOP-SIDE MARKING −55°C to 125°C SOIC − D TSSOP − PW Tape and reel Tape and reel SN74AHC04MDREP SN74AHC04MPWREP AHC04MEP AHC04EP ‡ Package drawings, standard packing quantities, thermal...