SN74AHC74-EP

SN74AHC74-EP DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH CLEAR AND PRESET SCLS489 – JUNE 2003 D Controlled Baseline – One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D EPIC (Enhanced-Performance Implanted CMOS) Process D Operating Range 2-V to 5.5-V VCC D Latch-Up Performance Exceeds 250 mA Per JESD 17 D ESD Protection Exceeds 2000 V Per MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. D OR PW PACKAGE (TOP VIEW) 1CLR 1 1D 2 1CLK 3 1PRE 4 1Q 5 1Q 6 GND 7 14 VCC 13 2CLR 12 2D 11 2CLK 10 2PRE 9 2Q 8 2Q description/ordering information The SN74AHC74 dual positive-edge-triggered device is a D-type flip-flop. A low level at the preset (PRE) or clear (CLR) inputs sets or resets the outputs, regardless of the levels of the other inputs. When PRE and CLR are inactive (high), data at the data (D)...