2-Input NAND Gate
TC7SG00AFS
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7SG00AFS
2-Input NAND Gate
Features
• High ou...
Description
TC7SG00AFS
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7SG00AFS
2-Input NAND Gate
Features
High output current
: ±8 mA (min) at VCC = 3.0 V
Super high speed operation : tpd = 2.5 ns (typ.)
at VCC = 3.3 V, 15pF
Operating voltage range : VCC = 0.9 to 3.6 V
5.5-V tolerant inputs
SO N5-P -0 .35
Weight: 0.001 g (typ.)
(fSV)
Marking
W1
Product Name
Pin Assignment (top view)
IN A 1 GND 2
5 VCC
IN B 3
4 OUT Y
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Supply voltage DC input voltage DC output voltage Input diode current Output diode current DC output current DC VCC/ground current Power dissipation Storage temperature
Symbol
Rating
Unit
VCC VIN VOUT IIK IOK IOUT ICC PD Tstg
−0.5 to 4.6
V
−0.5 to 7.0
V
−0.5 to VCC + 0.5
V
−20
mA
±20 (Note 1) mA
±25
mA
±50
mA
50
mW
−65 to 150
°C
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if
the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum
ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report
and estimated failure rate, etc).
Note1: VOUT < GN...
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