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FEATURES 1000 MHz Toggle Rate Driver/Comparator/Active Load and Dynamic Clamp Included Inhibit Mode Function 100-Lead ...
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FEATURES 1000 MHz Toggle Rate Driver/Comparator/Active Load and Dynamic Clamp Included Inhibit Mode Function 100-Lead LQFP Package with Built-In Heat Sink Driver 48 ⍀ Output Resistance 800 ps Tr/Tf for a 3 V Step Comparator 1.1 ns Propagation Delay at 3 V Load ؎40 mA Voltage Programmable Current Range 50 ns Settling Time to 15 mV APPLICATIONS Automatic Test Equipment Semiconductor Test Systems Board Test Systems Instrumentation and Characterization Equipment
VCC VH VTERM DATA DATAB IOD IODB RLD RLDB VL PWRD HCOMP VCCO QH QHB VCC
High Speed Dual Pin Electronic AD53522
FUNCTIONAL BLOCK DIAGRAM (One-Half)
VCC VEE VEE VEE
AD53522
VCH VHDCPL DRIVER OUT VLDCPL VCL
COMPARATOR QL QLB
PRODUCT DESCRIPTION
LCOMP
The AD53522 is a complete, high speed, single-chip solution that performs the pin electronics functions of driver, comparator, and active load (DCL) for ATE applications. In addition, the driver contains a dynamic clamp function and the active load contains an integrated
Schottky diode bridge. The driver is a proprietary design that features three active states: Data High mode, Data Low mode, and Term mode, as well as an Inhibit State. In conjunction with the integrated dynamic clamp, this facilitates the implementation of a high speed active termination. The output voltage range is –0.5 V to +6.5 V to accommodate a wide variety of test devices. The dual comparator, with an input range equal to the driver output range, features PECL compatible outputs. Signal tracking ca...