TLV5614-EP

TLV5614ĆEP 2.7ĆV TO 5.5ĆV 12ĆBIT 3Ƶs QUADRUPLE DIGITALĆTOĆANALOG CONVERTER WITH POWER DOWN SGLS355 − JUNE 2006 D Controlled Baseline − One Assembly − One Test Site − One Fabrication Site D Extended Temperature Performance of −55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D Four 12-Bit Digital-to-Analog Converters (DACs) D Programmable Settling Time of Either 3 µs or 9 µs (Typ) D TMS320E DSP Family, (Q)SPI, and Microwire Compatible Serial Interface D Internal Power-On Reset D Low Power Consumption: 8 mW, Slow Mode − 5-V Supply 3.6 mW, Slow Mode − 3-V Supply D Reference Input Buffer D Voltage Output Range . . . 2× the Reference Input Voltage D Monotonic Overtemperature D Dual 2.7-V to 5.5-V Supply (Separate Digital and Analog Supplies) D Hardware Power Down (10 nA) D Software Power Down (10 nA) D Simultaneous Update applications D Battery-Powered Test Instruments D Digital Offset and Gain Adjustment D Industrial Process Controls D Machine and Motion Control Devices D Communications D Arbitrary Waveform Generation † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing sho...