SN74AHCT138-EP

SN74AHCT138-EP 3-LINE TO 8-LINE DECODER/DEMULTIPLEXER D Controlled Baseline – One Assembly/Test Site, One Fabrication Site D Extended Temperature Performance of –55°C to 125°C D Enhanced Diminishing Manufacturing Sources (DMS) Support D Enhanced Product-Change Notification D Qualification Pedigree† D EPIC (Enhanced-Performance Implanted CMOS) Process D Inputs Are TTL-Voltage Compatible D Designed Specifically for High-Speed Memory Decoders and Data-Transmission Systems † Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SCLS491 – JUNE 2003 D Incorporates Three Enable Inputs to Simplify Cascading and/or Data Reception D Latch-Up Performance Exceeds 250 mA Per JESD 17 D ESD Protection Exceeds 2000 V Per MIL-STD-833, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0) D OR PW PACKAGE (TOP VIEW) A1 B2 C3 G2A 4 G2B 5 G1 6 Y7 7 GND 8 16 VCC 15 Y0 14 Y1 13 Y2 12 Y3 11 Y4 10 Y5 9 Y6 description/ordering information The SN74AHCT138 3-line to 8-line decoder/demultiplexer is designed to be used in high-performance memory-decoding and data-...