QUADRUPLE 2-INPUT POSITIVE-OR GATE
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FEATURES
• Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
• Extended Temperature Performa...
Description
www.ti.com
FEATURES
Controlled Baseline
– One Assembly/Test Site, One Fabrication Site
Extended Temperature Performance of –40°C to 125°C and –55°C to 125°C
Enhanced Diminishing Manufacturing Sources (DMS) Support
Enhanced Product-Change Notification Qualification Pedigree (1) ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V Using Machine Model (C = 200 pF, R = 0)
Operates From 2 V to 3.6 V
(1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.
SN74LVC32A-EP QUADRUPLE 2-INPUT POSITIVE-OR GATE
SCAS733C – NOVEMBER 2003 – REVISED MARCH 2007
Inputs Accept Voltages to 5.5 V
Max tpd of 3.8 ns at 3.3 V Typical VOLP (Output Ground Bounce)
<0.8 V at VCC = 3.3 V, TA = 25°C Typical VOHV (Output VOH Undershoot)
>2 V at VCC = 3.3 V, TA = 25°C ESD Protection Exceeds JESD 22
– 2000-V Human-Body Model (A114-A)
– 200-V Machine Model (A115-A)
– 1000-V Charged-Device Model (C101)
D OR PW PACKAGE (TOP VIEW)
1A 1 1B 2 1Y 3 2A 4 2B 5 2Y 6 GND 7
14 VCC 13 4B 12 4A 11 4Y 10 3B 9 3A 8 3Y
DESCRIPTION/ORDERING INFORMATION
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