SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E − JUNE 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F374 and
’BCT374 in the Normal-Function Mode
D Compatible With the IEEE Standard
1149.1-1990...
