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SN74BCT8373A Datasheet, Equivalent, SCAN TESTER.

SCAN TESTER

SCAN TESTER

 

 

 

Part SN74BCT8373A
Description SCAN TESTER
Feature SN54BCT8373A, SN74BCT8373A SCAN TEST DEV ICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D O ctal Test-Integrated Circuits D Functio nally Equivalent to ’F373 and ’BCT3 73 in the Normal-Function Mode D Compat ible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-S can Architecture D Test Operation Synch ronous to Test Access Port (TAP) D Impl ement Optional Test Reset Signal by Rec ognizing a Double-High-Level Voltage (1 0 V ) on TMS Pin D SCOPE ™ Instructio n Set – IEEE Standard 1149 .
Manufacture Texas Instruments
Datasheet
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Part SN74BCT8373A
Description SCAN TESTER
Feature SN54BCT8373A, SN74BCT8373A SCAN TEST DEV ICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D O ctal Test-Integrated Circuits D Functio nally Equivalent to ’F373 and ’BCT3 73 in the Normal-Function Mode D Compat ible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-S can Architecture D Test Operation Synch ronous to Test Access Port (TAP) D Impl ement Optional Test Reset Signal by Rec ognizing a Double-High-Level Voltage (1 0 V ) on TMS Pin D SCOPE ™ Instructio n Set – IEEE Standard 1149 .
Manufacture Texas Instruments
Datasheet
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SN74BCT8373A

SN74BCT8373A
SN74BCT8373A

SN74BCT8373A

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