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SN74BCT8240A Datasheet, Equivalent, SCAN TESTER.

SCAN TESTER

SCAN TESTER

 

 

 

Part SN74BCT8240A
Description SCAN TESTER
Feature SN54BCT8240A, SN74BCT8240A SCAN TEST DEV ICES WITH OCTAL INVERTING BUFFERS SCBS0 67E – FEBRUARY 1990 – REVISED DECEM BER 1996 D Members of the Texas Instru ments SCOPE ™ Family of Testability P roducts D Octal Test-Integrated Circuit s D Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mo de D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Oper ation Synchronous to Test Access Port ( TAP) D Implement Optional Test Reset Si gnal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE ™ Instruction Set – IEEE St .
Manufacture Texas Instruments
Datasheet
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Part SN74BCT8240A
Description SCAN TESTER
Feature SN54BCT8240A, SN74BCT8240A SCAN TEST DEV ICES WITH OCTAL INVERTING BUFFERS SCBS0 67E – FEBRUARY 1990 – REVISED DECEM BER 1996 D Members of the Texas Instru ments SCOPE ™ Family of Testability P roducts D Octal Test-Integrated Circuit s D Functionally Equivalent to ’F240 and ’BCT240 in the Normal-Function Mo de D Compatible With the IEEE Standard 1149.
1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Test Oper ation Synchronous to Test Access Port ( TAP) D Implement Optional Test Reset Si gnal by Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin D SCOPE ™ Instruction Set – IEEE St .
Manufacture Texas Instruments
Datasheet
Download SN74BCT8240A Datasheet

SN74BCT8240A

SN74BCT8240A
SN74BCT8240A

SN74BCT8240A

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