SCAN TESTER
SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E − MAY 1990 − REVISED JULY 1996
D Memb...
Description
SN54BCT8245A, SN74BCT8245A
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS
SCBS043E − MAY 1990 − REVISED JULY 1996
D Members of the Texas Instruments
SCOPE ™ Family of Testability Products
D Octal Test-Integrated Circuits D Functionally Equivalent to ’F245 and
’BCT245 in the Normal- Function Mode
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
D Test Operation Synchronous to Test
Access Port (TAP)
D Implement Optional Test Reset Signal by
Recognizing a Double-High-Level Voltage (10 V ) on TMS Pin
D SCOPE ™ Instruction Set
− IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
− Parallel-Signature Analysis at Inputs − Pseudo-Random Pattern Generation
From Outputs − Sample Inputs/Toggle Outputs
D Package Options Include Plastic
Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic and Ceramic 300-mil DIPs (JT, NT)
description
The ’BCT8245A scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE™ testability integratedcircuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
SN54BCT8245A . . . JT PACKAGE SN74BCT8245A . . . DW OR NT PACKAGE
(TOP VIEW)
DIR 1 B1 2 B2 3 B3 4 B4 5
GND 6 B5 7 B6 8 B7 9 B8 10
TDO 11 TMS 12
24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 1...
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