SN74BCT760-EP

www.ti.com FEATURES Controlled Baseline – One Assembly/Test Site, One Fabrication Site Extended Temperature Performance of –55°C to 125°C Enhanced Diminishing Manufacturing Sources (DMS) Support Enhanced Product-Change Notification Qualification Pedigree (1) Open-Collector Version of 'BCT244 Open-Collector Outputs Drive Bus Lines or Buffer Memory Address Registers ESD Protection Exceeds 2000 V Per MIL-STD-883C Method 3015 Available In Plastic Small-Outline (DW) Package (1) Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits. SN74BCT760-EP OCTAL BUFFER/DRIVER WITH OPEN-COLLECTOR OUTPUTS SCBS817B – JULY 2006 – REVISED SEPTEMBER 2006 DW PACKAGE (TOP VIEW) 1OE 1 1A1 2 2Y4 3 1A2 4 2Y3 5 1A3 6 2Y2 7 1A4 8 2Y1 9 GND 10 20 VCC 19 2OE 18 1Y1 17 2A4 16 1Y2 15 2A3 14 1Y3 13 2A2 12 1Y4 11 2A1 DESCRIPTION/ORDERING INFORMATION The SN74BCT760 octal buffer and line driver is designed specifically to improve both the performance and density of 3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74BCT760...