N-Channel MOSFET
MOSFET – Single N-Channel, SUPERFET) III, FRFET)
650 V, 30 A, 110 mW
NVH4L110N65S3F
Features
• Ultra Low Gate Charge & ...
Description
MOSFET – Single N-Channel, SUPERFET) III, FRFET)
650 V, 30 A, 110 mW
NVH4L110N65S3F
Features
Ultra Low Gate Charge & Low Effective Output Capacitance Lower FOM (RDS(on) max. x Qg typ. & RDS(on) max. x EOSS) AEC−Q101 Qualified and PPAP Capable These Devices are Pb−Free and are RoHS Compliant
MAXIMUM RATINGS (TC = 25°C unless otherwise noted)
Parameter
Symbol Value Unit
Drain−to−Source Voltage
VDSS
Gate−to−Source Voltage
− DC VGSS
Gate−to−Source Voltage
− AC (f > 1 Hz) VGSS
Drain Current
− Continuous (TC = 25°C)
ID
Drain Current
− Continuous (TC = 100°C)
ID
Drain Current
− Pulsed (Note 3) IDM
Power Dissipation
(TC = 25°C)
PD
Power Dissipation
− Derate Above 25°C PD
Operating Junction and Storage Temperature Range
TJ, TSTG
650 ±30 ±30 30 19.5 69 240 1.92 −55 to +150
V V V A A A W W/°C °C
Single Pulsed Avalanche Energy (Note 4) Repetitive Avalanche Energy (Note 3) MOSFET dv/dt
EAS EAR dv/dt
380 mJ 2.4 mJ 100 V/ns
Peak Diode Recovery dv/dt (Note 5)
dv/dt
50 V/ns
Max. Lead Temperature for Soldering Purposes
TL
(1/8″ from case for 5 s)
300 °C
THERMAL CHARACTERISTICS
Parameter
Thermal Resistance, Junction−to−Case, Max. (Notes 1, 2)
Symbol RqJC
Value 0.52
Unit °C/W
Thermal Resistance, Junction−to−Ambient, Max. (Notes 1, 2)
RqJA
40
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be...
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