SN54ABT8245

SN54ABT8245, SN74ABT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS124D – AUGUST 1992 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F245 and ’ABT245 in the Normal-Function Mode D SCOPE ™ Instruction Set: – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ – Parallel-Signature Analysis at Inputs With Masking Option – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Even-Parity Opcodes D Two Boundary-Scan Cells per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB™ BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Plastic Small-Outline Packages (DW), Ceramic Chip Carriers(FK), and Standard Ceramic DIPs (JT) description The ’ABT8245 scan test devices with octal bus transceivers are members of the Texas Instruments SCOPE ™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. SN54ABT8245 . . . JT PACKAGE SN74ABT8245 . . . DW PACKAGE (TOP VIEW) DIR 1 B1 2 B2 3 B3 4 B4 5 GND 6 B5 7 B6 8 B7 9 B8 10 TDO 11 TMS 12 24 OE 23 A1 22 A2 21 A3 20 A4 19 A5 18 VCC...