SN54ABT8652

SN54ABT8652, SN74ABT8652 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS AND REGISTERS SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996 D Members of the Texas Instruments SCOPE ™ Family of Testability Products D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D Functionally Equivalent to ’F652 and ’ABT652 in the Normal-Function Mode D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ – Parallel-Signature Analysis at Inputs With Masking Option – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Even-Parity Opcodes D Two Boundary-Scan Cells Per I/O for Greater Flexibility D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design Significantly Reduces Power Dissipation D Package Options Include Shrink Small-Outline (DL) and Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Ceramic DIPs (JT) description The ’ABT8652 scan test devices with octal bus transceivers and registers are members of the Texas Instruments SCOPE™ testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. A2 A3 GND A4 A5 A6 A7 SN54ABT8652 . . . JT PACKAGE SN74ABT8652 . . . DL OR DW PACKAGE (TOP VIEW) CLKAB 1 SAB 2 OEAB 3 A1...