Document
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A
SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
D Members of the Texas Instruments
SCOPE™ Family of Testability Products
D Members of the Texas Instruments
Widebus™ Family
D Compatible With the IEEE Standard
1149.1-1990 (JTAG) Test Access Port and
Boundary-Scan Architecture
D UBT ™ (Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
D Bus Hold on Data Inputs Eliminates the
Need for External Pullup Resistors
D B-Port Outputs of ’ABTH182504A Devices
Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required
D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design
D One Boundary-Scan Cell Per I/O
Architecture Improves Scan Efficiency
D SCOPE ™ Instruction Set
– IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ
– Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation
From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes
D Packaged in 64-Pin Plastic Thin Quad Flat
(PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings
SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE (TOP VIEW)
A3 A2 A1 GND OEBA LEBA TDO VCC NC TMS CLKBA CLKENBA B1 GND B2 B3 B4
A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16
9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61
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27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43
B5 B6 B7 GND B8 B9 B10 VCC NC B11 B12 B13 B14 GND B15 B16 B17
A17 A18 A19 GND A20 CLKENAB CLKAB TDI NC VCC TCK LEAB OEAB GND B20 B19 B18
NC – No internal connection
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated.
UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters.
• POST OFFICE BOX 655303 DALLAS, TEXAS 75265
Copyright © 1996, Texas Instruments Incorporated On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters.
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SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS165C – AUGUST 1993 – REVISED JULY 1996
SN74ABTH18504A, SN74ABTH182504A . . . PM PACKAGE (TOP V.