DatasheetsPDF.com

SN54ABTH18504A Dataheets PDF



Part Number SN54ABTH18504A
Manufacturers Texas Instruments
Logo Texas Instruments
Description SCAN TEST DEVICES
Datasheet SN54ABTH18504A DatasheetSN54ABTH18504A Datasheet (PDF)

SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transpar.

  SN54ABTH18504A   SN54ABTH18504A



Document
SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 D Members of the Texas Instruments SCOPE™ Family of Testability Products D Members of the Texas Instruments Widebus™ Family D Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture D UBT ™ (Universal Bus Transceiver) Combines D-Type Latches and D-Type Flip-Flops for Operation in Transparent, Latched, or Clocked Mode D Bus Hold on Data Inputs Eliminates the Need for External Pullup Resistors D B-Port Outputs of ’ABTH182504A Devices Have Equivalent 25-Ω Series Resistors, So No External Resistors Are Required D State-of-the-Art EPIC-ΙΙB ™ BiCMOS Design D One Boundary-Scan Cell Per I/O Architecture Improves Scan Efficiency D SCOPE ™ Instruction Set – IEEE Standard 1149.1-1990 Required Instructions and Optional CLAMP and HIGHZ – Parallel-Signature Analysis at Inputs – Pseudo-Random Pattern Generation From Outputs – Sample Inputs/Toggle Outputs – Binary Count From Outputs – Device Identification – Even-Parity Opcodes D Packaged in 64-Pin Plastic Thin Quad Flat (PM) Packages Using 0.5-mm Center-to-Center Spacings and 68-Pin Ceramic Quad Flat (HV) Packages Using 25-mil Center-to-Center Spacings SN54ABTH18504A, SN54ABTH182504A . . . HV PACKAGE (TOP VIEW) A3 A2 A1 GND OEBA LEBA TDO VCC NC TMS CLKBA CLKENBA B1 GND B2 B3 B4 A4 A5 A6 GND A7 A8 A9 A10 NC VCC A11 A12 A13 GND A14 A15 A16 9 8 7 6 5 4 3 2 1 68 67 66 65 64 63 62 61 10 60 11 59 12 58 13 57 14 56 15 55 16 54 17 53 18 52 19 51 20 50 21 49 22 48 23 47 24 46 25 45 26 44 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 B5 B6 B7 GND B8 B9 B10 VCC NC B11 B12 B13 B14 GND B15 B16 B17 A17 A18 A19 GND A20 CLKENAB CLKAB TDI NC VCC TCK LEAB OEAB GND B20 B19 B18 NC – No internal connection Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. SCOPE, Widebus, UBT, and EPIC-ΙΙB are trademarks of Texas Instruments Incorporated. UNLESS OTHERWISE NOTED this document contains PRODUCTION DATA information current as of publication date. Products conform to specifications per the terms of Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. • POST OFFICE BOX 655303 DALLAS, TEXAS 75265 Copyright © 1996, Texas Instruments Incorporated On products compliant to MIL-PRF-38535, all parameters are tested unless otherwise noted. On all other products, production processing does not necessarily include testing of all parameters. 1 SN54ABTH18504A, SN54ABTH182504A, SN74ABTH18504A, SN74ABTH182504A SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS165C – AUGUST 1993 – REVISED JULY 1996 SN74ABTH18504A, SN74ABTH182504A . . . PM PACKAGE (TOP V.


SN74ABTH182502A SN54ABTH18504A SN54ABTH182504A


@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site.
(Privacy Policy & Contact)