HYB3116160BST-70

1M x 16-Bit Dynamic RAM (1k & 4k -Refresh) HYB3116160BSJ/BST(L)-50/-60/-70 HYB3118160BSJ/BST(L)-50/-60/-70 Advanced Information 1 048 576 words by 16-bit organization 0 to 70 °C operating temperature Performance: -50 tRAC tCAC tAA tRC tPC RAS access time CAS access time Access time from address Read/Write cycle time Fast page mode cycle time 50 13 25 90 35 -60 60 15 30 110 40 -70 70 20 35 130 45 ns ns ns ns ns Single + 3.3 V (± 0.3 V) supply Low power dissipation max. 720 active mW ( HYB3118160BSJ/BST-50) max. 648 active mW ( HYB3118160BSJ/BST-60) max. 576 active mW ( HYB3118160BSJ/BST-70) max. 360 active mW ( HYB3116160BSJ/BST-50) max. 324 active mW ( HYB3116160BSJ/BST-60) max. 288 active mW ( HYB3116160BSJ/BST-70) 7.2 mW standby (LV-TTL) 3.6 mW standby (LV-CMOS) 720 µW standby for L-version Output unlatched at cycle end allows two-dimensional chip selection Read, write, read-modify-write, CAS-before-RAS refresh, RAS-only refresh, hidden refresh, self refresh Fast page mode capability 2 CAS / 1 WE All inputs, outputs and clocks fully LV-TTL-compatible 1024 refresh cycles / 16 ms for HYB 3118160BSJ 4096 refresh cycles / 64 ms for HYB 3116160BSJ Plastic Package: P-SOJ-42-1 400 mil P-TSOPII-50/44-1 400mil Semiconductor Group 1 1.96 HYB3116(8)160BSJ/BST(L)-50/-60/-70 3.3V 1M x 16-DRAM The HYB 3116(8)160BSJ/BST is a 16 MBit dynamic RAM organized as 1 048 576 words by 16 bits. The HYB 3116(8)160BSJ/BST utilizes a submicron CMOS silicon gate pro...