MOSFET Drivers. HS-4424RH Datasheet

HS-4424RH Drivers. Datasheet pdf. Equivalent

Part HS-4424RH
Description Non-Inverting Power MOSFET Drivers
Feature Datasheet HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH Radiation Hardened Dual, Non-Inverting Power.
Manufacture Intersil Corporation
Datasheet
Download HS-4424RH Datasheet




HS-4424RH
Datasheet
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
Radiation Hardened Dual, Non-Inverting Power MOSFET Drivers
The radiation hardened HS-4424RH, HS-4424EH,
HS-4424BRH and HS-4424BEH are non-inverting,
dual, monolithic high-speed MOSFET drivers
designed to convert TTL level signals into high current
outputs at voltages up to 18V.
The inputs of these devices are TTL compatible and
can be directly driven by our HS-1825ARH PWM
device or by our ACS/ACTS and HCS/HCTS type
logic devices. The fast rise times and high current
outputs allow very quick control of high gate
capacitance power MOSFETs in high frequency
applications.
The high current outputs minimize power losses in
MOSFETs by rapidly charging and discharging the
gate capacitance. The output stage incorporates a
low voltage lockout circuit that puts the outputs into a
three-state mode when the supply voltage drops
below 10V for the HS-4424RH, HS-4424EH and 7.5V
for the HS-4424BRH, HS-4424BEH.
Constructed with the dielectrically isolated Rad Hard
Silicon Gate (RSG) BiCMOS process, these devices
are immune to single event latch-up and have been
specifically designed to provide highly reliable
performance in harsh radiation environments.
Detailed Electrical Specifications for these devices
are contained in SMD 5962-99560.
Related Literature
For a full list of related documents, visit our website:
HS-4424RH, HS-4424EH, HS-4424BRH and
HS-4424BEH device pages
Table 1. Table of Differences
Part Number
HS-4424RH, HS-4424BRH
HS-4424EH, HS-4424BEH
Features
• Electrically screened to DESC SMD # 5962-99560
• QML qualified per MIL-PRF-38535 requirements
• Radiation environment
○ High dose rate (50-300rad(Si)/s): 300krad(Si)
○ Latch-up immune
○ Low dose rate (0.01rad(Si)/s): 50krad(Si)
(EH products only)
• IPEAK: >2A (min)
• Matched rise and fall times (CL = 4300pF): 75ns
(maximum)
• Low voltage lockout feature
○ HS-4424RH, HS-4424EH: <10.0V
○ HS-4424BRH, HS-4424BEH: <7.5V
• Wide supply voltage range: 12V to 18V
• Prop delay: 250ns (maximum)
• Consistent delay times with VCC changes
• Low power consumption
○ 40mW with inputs high
○ 20mW with inputs low
• Low equivalent input capacitance: 3.2pF (typical)
• ESD protected: >4000V
Applications
• Switching power supplies
• DC/DC converters
• Motor controllers
Dose Rate (rad(Si)/s)
50-300
0.01
FN4739 Rev.3.00
Jun.11.19
Page 1 of 6



HS-4424RH
HS-4424RH, HS-4424EH, HS-4424BRH, HS-4424BEH
1. Overview
1. Overview
1.1 Ordering Information
Ordering SMD Number
(Note 2)
Part Number
(Notes 1, 3)
Package
Temperature Range (°C) (RoHS Compliant)
Pkg. Dwg. #
5962F9956004V9A
HS0-4424BEH-Q
-55 to +125
DIE
5962F9956002V9A
HS0-4424BRH-Q
-55 to +125
DIE
N/A
HS0-4424BRH/SAMPLE
-55 to +125
DIE SAMPLE
5962F9956003V9A
HS0-4424EH-Q
-55 to +125
DIE
5962F9956001V9A
HS0-4424RH-Q
-55 to +125
DIE
N/A
HS0-4424RH/SAMPLE
-55 to +125
DIE SAMPLE
5962F9956001VXC
HS9-4424RH-Q
-55 to +125
16 Ld Flatpack
K16.A
5962F9956004VXC
HS9-4424BEH-Q
-55 to +125
16 Ld Flatpack
K16.A
5962F9956003VXC
HS9-4424EH-Q
-55 to +125
16 Ld Flatpack
K16.A
5962F9956002QXC
HS9-4424BRH-8
-55 to +125
16 Ld Flatpack
K16.A
5962F9956002VXC
HS9-4424BRH-Q
-55 to +125
16 Ld Flatpack
K16.A
N/A
HS9-4424BRH/PROTO
-55 to +125
16 Ld Flatpack
K16.A
N/A
HS9-4424RH/PROTO
-55 to +125
16 Ld Flatpack
K16.A
5962F9956001QXC
HS9-4424RH-8
-55 to +125
16 Ld Flatpack
K16.A
Notes:
1. These Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with
both SnPb and Pb-free soldering operations.
2. Specifications for Rad Hard QML devices are controlled by the Defense Logistics Agency Land and Maritime (DLA). The SMD numbers
must be used when ordering.
3. The /PROTO and /SAMPLE are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. These parts are
intended for engineering evaluation purposes only. The /PROTO parts meet the electrical limits and conditions across temperature
specified in the DLA SMD and are in the same form and fit as the qualified device. The /SAMPLE parts are capable of meeting the
electrical limits and conditions specified in the DLA SMD at +25°C only. The /SAMPLE parts do not receive 100% screening across
temperature to the DLA SMD electrical limits. These part types do not come with a Certificate of Conformance because they are not DLA
qualified devices.
1.2 Pin Configuration
Flatpack CDFP4-F16
Top View
NC
IN A
NC
GND A
GND B
NC
IN B
NC
1 16
2 15
3 14
4 13
5 12
6 11
7 10
89
NC
OUT A
OUT A
VCC
VCC
OUT B
OUT B
NC
FN4739 Rev.3.00
Jun.11.19
Page 2 of 6







@ 2014 :: Datasheetspdf.com :: Semiconductors datasheet search & download site (Privacy Policy & Contact)