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HSC276

Hitachi Semiconductor

Silicon Schottky Barrier Diode for Mixer

HSC276 Silicon Schottky Barrier Diode for Mixer ADE-208-421A(Z) Rev 1 Dec. 1998 Features • High forward current, Low ca...


Hitachi Semiconductor

HSC276

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Description
HSC276 Silicon Schottky Barrier Diode for Mixer ADE-208-421A(Z) Rev 1 Dec. 1998 Features High forward current, Low capacitance. Ultra small Flat Package (UFP) is suitable for surface mount design. Ordering Information Type No. HSC276 Laser Mark C2 Package Code UFP Outline Cathode mark Mark 1 C2 2 1. Cathode 2. Anode HSC276 Absolute Maximum Ratings (Ta = 25°C) Item Reverse voltage Average rectified current Junction temperature Storage temperature Symbol VR IO Tj Tstg Value 3 30 125 -55 to +125 Unit V mA °C °C Electrical Characteristics (Ta = 25°C) Item Reverse voltage Reverse current Forward current Capacitance ESD-Capability *1 Symbol VR IR IF C — Min 3 — 35 — 30 Typ — — — — — Max — 50 — 0.85 — Unit V µA mA pF V Test Condition I R = 1 mA VR = 0.5V VF = 0.5V VR = 0.5V, f = 1 MHz C=200pF , Both forward and reverse direction 1 pulse. Notes 1. Failure criterion ; IR ≥ 100µA at VR =0.5 V 2 HSC276 Main Characteristic -2 10 -2 10 Reverse current I R (A) Forward current IF (A) 10 -3 10 -3 10 -4 10 -4 10 -5 10 -5 10-6 0 0.1 0.2 0.3 0.4 10 -6 0 1 2 3 4 5 Forward voltage V F (V) Fig.1 Forward current Vs. Forward voltage Reverse voltage V R (V) Fig.2 Reverse current Vs. Reverse voltage f=1MHz 10 (pF) Capacitance C 1.0 10 -1 10 -1 1.0 Reverse voltage V R (V) 10 Fig.3 Capacitance Vs. Reverse voltage 3 HSC276 Package Dimensions Unit : mm Cathode Mark 1 C2 1.2 ± 0.10 1.6 ± 0.10 2 0.3 ± 0.05 0.8 ± 0.10 1. Cathode 2. Anode H...




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