SCAN18374T

SCAN18374T D Flip-Flop with TRI-STATE Outputs September 1998 SCAN18374T D Flip-Flop with TRI-STATE ® Outputs General Description The SCAN18374T is a high speed, low-power D-type flip-flop featuring separate D-type inputs organized into dual 9-bit bytes with byte-oriented clock and output enable control signals. This device is compliant with IEEE 1149.1 Standard Test Access Port and BOUNDARY-SCAN Architecture with the incorporation of the defined BOUNDARY-SCAN test logic and test access port consisting of Test Data Input (TDI), Test Data Out (TDO), Test Mode Select (TMS), and Test Clock (TCK). Features n n n n n n n n n n IEEE 1149.1 (JTAG) Compliant Buffered positive edge-triggered clock TRI-STATE outputs for bus-oriented applications 9-bit data busses for parity applications Reduced-swing outputs source 24 mA/sink 48 mA (Mil) Guaranteed to drive 50Ω transmission line to TTL input levels of 0.8V and 2.0V TTL compatible inputs 25 mil pitch Cerpack packaging Includes CLAMP and HIGHZ instructions Standard Microcircuit Drawing (SMD) 5962-9320701 Connection Diagram Pin Names AOE1, BOE1 AO(0–8), BO(0–8) Description TRI-STATE Output Enable Inputs TRI-STATE Outputs DS100322-1 Pin Names AI(0–8), BI(0–8) ACP, BCP TRI-STATE ® Description Data Inputs Clock Pulse Inputs is a registered trademark of National Semiconductor Corporation. © 1998 National Semiconductor Corporation DS100322 www.national.com Truth Tables Inputs ACP X N N AOE1 H L L Inputs BCP X N N H = HIGH Voltage ...