Document
CMOS Digital Integrated Circuits Silicon Monolithic
TC7WH74FK
TC7WH74FK
1. Functional Description
• D-Type Flip Flop with Preset and Clear
2. Features
(1) AEC-Q100 (Rev. H) (Note 1) (2) Wide operating temperature range: Topr = -40 to 125 (Note 2) (3) High speed operation: fMAX = 170 MHz (typ.) (VCC = 5.0 V) (4) Low power dissipation: ICC = 2.0 µA (max) (Ta = 25 ) (5) High noise immunity: VNIH = VNIL = 28 % VCC (min) (6) 5.5 V tolerant inputs (7) Balanced propagation delays: tPLH ≈ tPHL (8) Wide operating voltage range: VCC = 2.0 to 5.5 V
Note 1: This device is compliant with the reliability requirements of AEC-Q100. For details, contact your Toshiba sales representative.
Note 2: For devices with the ordering part number ending in J(CT. Topr = -40 to 85 for the other devices.
3. Packaging
US8
©2016 Toshiba Corporation
1
Start of commercial production
1994-07
2017-04-13 Rev.3.0
4. Marking and Pin Assignment
TC7WH74FK
Marking
5. IEC Logic Symbol
Pin Assignment (Top view)
6. Truth Table
X: Don't care
©2016 Toshiba Corporation
2
2017-04-13 Rev.3.0
TC7WH74FK
7. Absolute Maximum Ratings (Note) (Unless otherwise specified, Ta = 25 )
Characteristics
Symbol
Note
Rating
Unit
Supply voltage
VCC
-0.5 to 7.0
V
Input voltage
VIN
-0.5 to 7.0
DC output voltage
VOUT
-0.5 to VCC + 0.5
Input diode current
IIK
-20
mA
Output diode current
IOK
(Note 1)
±20
DC output current
IOUT
±25
VCC/ground current
ICC
±50
Power dissipation
PD
200
mW
Storage temperature
Tstg
-65 to 150
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Note 1: VOUT < GND, VOUT > VCC
8. Operating Ranges (Note)
Characteristics
Symbol
Note
Test Condition
Rating
Unit
Supply voltage
VCC
2.0 to 5.5
V
Input voltage Output voltage
VIN VOUT
0 to 5.5
0 to VCC
Operating temperature
Topr
(Note 1)
-40 to 125
(Note 2)
-40 to 85
Input rise and fall time
dt/dv
VCC = 3.3 ± 0.3 V
0 to 100
ns/V
VCC = 5.0 ± 0.5 V
0 to 20
Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs and bus inputs must be tied to either VCC or GND.
Note 1: For devices with the ordering part number ending in J(CT. Note 2: For devices except those with the ordering part number ending in J(CT.
©2016 Toshiba Corporation
3
2017-04-13 Rev.3.0
TC7WH74FK
9. Electrical Characteristics 9.1. DC Characteristics (Unless otherwise specified, Ta = 25 )
Characteristics High-level input voltage Low-level input voltage High-level output voltage
Low-level output voltage
Input leakage current Quiescent supply current
Symbol
Test Condition
VCC (V)
Min
Typ.
Max
Unit
VIH
VIL
VOH VIN = VIL or VIH
2.0
1.5
V
3.0 to 5.5 VCC × 0.7
2.0
0.5
V
3.0 to 5.5
IOH = -50 µA
2.0
1.9
3.0
2.9
VCC × 0.3
2.0
V
3.0
4.5
4.4
4.5
IOH = -4 mA
3.0
IOH = -8 mA
4.5
VOL VIN = VIL or VIH
IOL = 50 µA
2.0
3.0
2.58
3.94
0.0
0.1
V
0.0
0.1
4.5
0.0
0.1
IOL = 4 mA
3.0
IOL = 8 mA
4.5
IIN VIN = 5.5 V or GND
0 to 5.5
ICC VIN = VCC or GND
5.5
0.36
0.36
±0.1
µA
2.0
µA
9.2. DC Characteristics (Unless otherwise specified, Ta = -40 to 85 )
Characteristics High-level input voltage Low-level input voltage High-level output voltage
Low-level output voltage
Input leakage current Quiescent supply current
Symbol
Test Condition
VCC (V)
Min
Max
Unit
VIH
2.0
1.5
V
3.0 to 5.5 VCC × 0.7
VIL
2.0 3.0 to 5.5
0.5
V
VCC × 0.3
VOH VIN = VIL or VIH
IOH = -50 µA
2.0
1.9
V
3.0
2.9
4.5
4.4
VOL VIN = VIL or VIH
IOH = -4 mA
3.0
2.48
IOH = -8 mA
4.5
3.80
IOL = 50 µA
2.0
0.1
V
3.0
0.1
4.5
0.1
IIN VIN = 5.5 V or GND ICC VIN = VCC or GND
IOL = 4 mA
3.0
IOL = 8 mA
4.5
0 to 5.5
5.5
0.44
0.44
±1.0
µA
20.0
µA
©2016 Toshiba Corporation
4
2017-04-13 Rev.3.0
TC7WH74FK
9.3. DC Characteristics (Note) (Unless otherwise specified, Ta = -40 to 125 )
Characteristics
Symbol
Test Condition
VCC (V)
Min
Max
Unit
High-level input voltage Low-level input v.