MMA3201D Micromachined Accelerometer Datasheet

MMA3201D Datasheet, PDF, Equivalent


Part Number

MMA3201D

Description

Surface Mount Micromachined Accelerometer

Manufacture

Motorola

Total Page 8 Pages
Datasheet
Download MMA3201D Datasheet


MMA3201D
Freescale Semiconductor, Inc.
MOTOROLA
SEMICONDUCTOR TECHNICAL DATA
Order Number: MMA3201D
Rev. 2, 06/2004
Surface Mount
Micromachined Accelerometer
MMA3201D
The MMA3200 series of dual axis (X and Y) silicon capacitive, micromachined
accelerometers features signal conditioning, a 4-pole low pass filter and temperature
compensation, and separate outputs for the two axes. Zero-g offset full scale span
and filter cut-off are factory set and require no external devices. A full system self-test
capability verifies system functionality.
Features
• Sensitivity in two separate axes: 40g X-axis and 40g Y-axis
• Integral Signal Conditioning
• Linear Output
• Ratiometric Performance
• 4th Order Bessel Filter Preserves Pulse Shape Integrity
• Calibrated Self-test
• Low Voltage Detect, Clock Monitor, and EPROM Parity Check Status
• Transducer Hermetically Sealed at Wafer Level for Superior Reliability
• Robust Design, High Shocks Survivability
Typical Applications
• Vibration Monitoring and Recording
• Impact Monitoring
• Appliance Control
• Mechanical Bearing Monitoring
• Computer Hard Drive Protection
• Computer Mouse and Joysticks
• Virtual Reality Input Devices
• Sports Diagnostic Devices and Systems
ORDERING INFORMATION
Device
Temperature
Range
Package
MMA3201D
– 40 to +125°C SOIC-20
MMA3201DR2 – 40 to +125°C SOIC-20, Tape & Reel
MMA3201D: X-Y AXIS SENSITIVITY
MICROMACHINED
ACCELEROMETER
±40g
20 LEAD SOIC
CASE 475A-01
PIN ASSIGNMENT
N/C
N/C
N/C
N/C
ST
XOUT
STATUS
VSS
VDD
AVDD
1
2
3
4
5
6
7
8
9
10
20 GND
19 N/C
18 N/C
17 N/C
16 N/C
15 N/C
14 N/C
13 N/C
12 N/C
11 YOUT
REV 2
© Motorola, Inc. 2004
AVDD
G-Cell
Sensor
ST
Self-Test
Integrator
Gain
Filter
Temp
Control Logic &
EPROM
Trim Circuits
Oscillator
Clock
Gen.
VDD
XOUT
YOUT
VSS
Status
Figure 1. Simplified Accelerometer Functional Block Diagram
For More Information On This Product,
Go to: www.freescale.com

MMA3201D
Freescale Semiconductor, Inc.
Maximum Ratings
(Maximum ratings are the limits to which the device can be exposed without causing permanent damage.)
Rating
Powered Acceleration (all axes)
Unpowered Acceleration (all axes)
Supply Voltage
Drop Test (1)
Storage Temperature Range
Symbol
Gpd
Gupd
VDD
Ddrop
Tstg
Value
1500
2000
–0.3 to +7.0
1.2
–40 to +125
Unit
g
g
V
m
°C
NOTES:
1. Dropped onto concrete surface from any axis.
ELECTRO STATIC DISCHARGE (ESD)
WARNING: This device is sensitive to electrostatic
discharge.
Although the Motorola accelerometers contain internal 2kV
ESD protection circuitry, extra precaution must be taken by the
user to protect the chip from ESD. A charge of over 2000 volts
can accumulate on the human body or associated test
equipment. A charge of this magnitude can alter the
performance or cause failure of the chip. When handling the
accelerometer, proper ESD precautions should be followed to
avoid exposing the device to discharges which may be
detrimental to its performance.
MMA3201D
2
For More Information On This Product,
Go to: www.freescale.com
Motorola Sensor Device Data


Features MOTOROLA Freescale Semiconductor, Inc. Order Number: MMA3201D Rev. 2, 06/2004 SEMICONDUCTOR TECHNICAL DATA Surface Mount Micromachined Accelerometer The M MA3200 series of dual axis (X and Y) si licon capacitive, micromachined acceler ometers features signal conditioning, a 4-pole low pass filter and temperature compensation, and separate outputs for the two axes. Zero-g offset full scale span and filter cut-off are factory se t and require no external devices. A fu ll system self-test capability verifies system functionality. Features • Sen sitivity in two separate axes: 40g X-ax is and 40g Y-axis • Integral Signal C onditioning • Linear Output • Ratio metric Performance • 4th Order Bessel Filter Preserves Pulse Shape Integrity • Calibrated Self-test • Low Volta ge Detect, Clock Monitor, and EPROM Par ity Check Status • Transducer Hermeti cally Sealed at Wafer Level for Superio r Reliability • Robust Design, High S hocks Survivability Typical Applications • Vibration Monitoring and Recording • I.
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