Erasable PROM. NTE2732A Datasheet

NTE2732A PROM. Datasheet pdf. Equivalent

Part NTE2732A
Description Integrated Circuit 32K (4K x 8) NMOS UV Erasable PROM
Feature NTE2732A Integrated Circuit 32K (4K x 8) NMOS UV Erasable PROM Description: The NTE2732A is a 32,768.
Manufacture NTE
Datasheet
Download NTE2732A Datasheet



NTE2732A
NTE2732A
Integrated Circuit
32K (4K x 8) NMOS UV Erasable PROM
Description:
The NTE2732A is a 32,768–bits ultraviolet erasable and electrically programmable read–only
memory (EPROM) organized as 4,096 words by 8 bits and manufactured using N–Channel Si–Gate
MOS processing. With its single +5V power supply and with an access time of 200ns, the NTE2732A
is ideal for use with high performance +5V microprocessors such as the NTE3880.
The NTE2732A has an important feature which is the separate output control, Output Enable (OE)
from the Chip Enable control (CE). The OE control eliminates bus contention in multiple bus micropro-
cessor systems.
The NTE2732A also features an standby mode which reduces the power dissipation without increas-
ing access time. The active current is 125mA while the maximum standby mode is achieved by apply-
ing a TTL–high signal to the CE input.
Features:
D Fast Access Time: 200ns Max
D 0° to +70°C Standard Temperature Range
D Single +5V Power Supply
D Low Standby Current (35mA Max)
D Inputs and Outputs TTL Compatible During Read and Program
D Completely Static
Absolute Maximum Ratings: (Note 1)
All Input or Output Voltages with respect to GND, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +6 to –0.6V
Supply Voltage with respect to GND during Program, Vpp . . . . . . . . . . . . . . . . . . . . . . . +22 to –0.6V
Ambient Temperature under Bias, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –10° to +80°C
Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65° to +125°C
Note 1. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this specifi-
cation is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
Operating Modes:
MODE
READ
STANDBY
PROGRAM
PROGRAM VERIFTY
PROGRAM INHIBIT
PINS
CE
(18)
VIL
VIH
VIL
VIL
VIH
OE/Vpp
(20)
VIL
Don’t Care
VPP
VIL
VPP
VCC OUTPUTS
(24) (9 – 11, 13–17)
+5 DOUT
+5 HIGH Z
+5 DIN
+5 DOUT
+5 HIGH Z



NTE2732A
Read Operation (DC and AC Conditions):
Operating Temperature Range, Topr . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0° to +70°C
VCC Power Supply (Note 2, Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5V ± 5%
Vpp Voltage (Note 3) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Vpp = VCC
Note 2. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
Note 3. VPP may be connected directly to VCC except during programming. The supply current
would then be the sum of ICC and IPP1.
DC and Operating Characteristics:
Parameter
Symbol
Test Conditions
Min Typ Max Unit
Input Load Current
Output Leakage Current
VCC Current Standby
VCC Current Standby
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
ILI
ILO
ICC1
ICC2
VIL
VIH
VOL
VOH
VIN = 5.5V
VOUT = 5.5V
CE = VIH, OE = VIL, Note 3
CE = OE = VIL, Note 3
IOL= 2.1mA
IOH = 400µA
––
––
––
70
0.1
2.0
––
2.4
10
10
35
125
+0.8
VCC+1
0.45
µA
µA
mA
mA
V
V
V
V
Note 3. VPP may be connected directly to VCC except during programming. The supply current
would then be the sum of ICC and IPP1.
Note 4. Typical values are for TA = +25°C and nominal supply voltages.
AC Characteristics:
Parameter
Symbol
Test Conditions
Min Typ Max Unit
Address to Output Delay
CE to Output Delay
OE to Output Delay
OE High to Output Float
Output Hold from Addresses CE or
OE whichever occurred first
tACC
tCE
tOE
tDF
tOH
CE = OE = VIL
OE = VIL
CE = VIL
CE = VIL, Note 5
CE = OE = VIL
––
––
––
0
0
200 ns
200 ns
100 ns
60 ns
ns
Note 4. Typical values are for TA = +25°C and nominal supply voltages.
Note 5. This parameter is only sampled and is not 100% tested.
Capacitance: (TA = +25°C, f = 1MHz, Note 5 unless otherwise specified)
Parameter
Symbol
Test Conditions
Min Typ Max Unit
Input Capacitance except OE/Vpp
OE/Vpp Input Capacitance
Output capacitance
CIN1
CIN2
COUT
VIN = 0
VIN = 0
VOUT = 0
4
––
8
6 pF
20 pF
12 pF
Note 4. Typical values are for TA = +25°C and nominal supply voltages.
Note 5. This parameter is only sampled and is not 100% tested.
Read Operation (AC Test Conditions):
Output Load: 100pF + 1TTL Gate
Input Rise and Fall Times: 20ns
Input Pulse Levels: 0.45 to 2.4V
Timing Measurement Reference Levels: Inputs 0.8 and 2V/0.8 and 2V







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