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IRHM7450SE Dataheets PDF



Part Number IRHM7450SE
Manufacturers IRF
Logo IRF
Description TRANSISTOR N-CHANNEL
Datasheet IRHM7450SE DatasheetIRHM7450SE Datasheet (PDF)

Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1223B REPETITIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR IRHM7450SE N-CHANNEL SINGLE EVENT EFFECT (SEE) RAD HARD 500 Volt, 0.51Ω , (SEE) RAD HARD HEXFET International Rectifier’s (SEE) RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure. Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications u.

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Previous Datasheet Index Next Data Sheet Provisional Data Sheet No. PD-9.1223B REPETITIVE AVALANCHE AND dv/dt RATED HEXFET® TRANSISTOR IRHM7450SE N-CHANNEL SINGLE EVENT EFFECT (SEE) RAD HARD 500 Volt, 0.51Ω , (SEE) RAD HARD HEXFET International Rectifier’s (SEE) RAD HARD technology HEXFETs demonstrate virtual immunity to SEE failure. Additionally, under identical pre- and post-radiation test conditions, International Rectifier’s RAD HARD HEXFETs retain identical electrical specifications up to 1 x 105 Rads (Si) total dose. No compensation in gate drive circuitry is required. These devices are also capable of surviving transient ionization pulses as high as 1 x 1012 Rads (Si)/Sec, and return to normal operation within a few microseconds. Since the SEE process utilizes International Rectifier’s patented HEXFET technology, the user can expect the highest quality and reliability in the industry. RAD HARD HEXFET transistors also feature all of the well-established advantages of MOSFETs, such as voltage control, very fast switching, ease of paralleling and temperature stability of the electrical parameters. They are well-suited for applications such as switching power supplies, motor controls, inverters, choppers, audio amplifiers and high-energy pulse circuits in space and weapons environments. Product Summary Part Number IRHM7450SE BVDSS 500V RDS(on) 0.51Ω ID 12A Features: s s s s s s s s s s s s s Radiation Hardened up to 1 x 10 5 Rads (Si) Single Event Burnout (SEB) Hardened Single Event Gate Rupture (SEGR) Hardened Gamma Dot (Flash X-Ray) Hardened Neutron Tolerant Identical Pre- and Post-Electrical Test Conditions Repetitive Avalanche Rating Dynamic dv/dt Rating Simple Drive Requirements Ease of Paralleling Hermetically Sealed Electrically Isolated Ceramic Eyelets Absolute Maximum Ratings Parameter ID @ VGS = 12V, TC = 25°C I D @ VGS = 12V, TC = 100°C IDM PD @ TC = 25°C VGS EAS IAR EAR dv/dt TJ TSTG Continuous Drain Current Continuous Drain Current Pulsed Drain Current Œ Max. Power Dissipation Linear Derating Factor Gate-to-Source Voltage Single Pulse Avalanche Energy  Avalanche Current Œ Repetitive Avalanche Energy Œ Peak Diode Recovery dv/dt Ž Operating Junction Storage Temperature Range Lead Temperature Weight Pre-Radiation IRHM7450SE 12 7 48 150 1.2 ±20 500 12 15 3.5 -55 to 150 300 (0.063 in. (1.6mm) from case for 10 sec.) 9.3 (typical) Units A W W/K  V mJ A mJ V/ns oC To Order g Previous Datasheet IRHM7450SE Device Index Next Data Sheet Pre-Radiation Electrical Characteristics @ Tj = 25°C (Unless Otherwise Specified) Parameter BVDSS ∆BVDSS/∆TJ RDS(on) VGS(th) gfs IDSS Drain-to-Source Breakdown Voltage Temperature Coefficient of Breakdown Voltage Static Drain-to-Source On-State Resistance Gate Threshold Voltage Forward Transconductance Zero Gate Voltage Drain Current Min. 500 — — — 2.5 3 — — — — — — — — — — — — Typ. Max. Units — 0.6 — — — — — — — — — — — — — — — 8.7 — — 0.51 0.57 4.5 — 50 250 100 -100 140 50 60 35 50 100.


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