NAND Gate. 54AC00 Datasheet

54AC00 Gate. Datasheet pdf. Equivalent


National Semiconductor 54AC00
www.DataSheet4U.com
July 2003
54AC00/54ACT00
Quad 2-Input NAND Gate
General Description
The ’AC/’ACT00 contains four 2-input NAND gates.
Features
n ICC reduced by 50%
n Outputs source/sink 24 mA
n ’ACT00 has TTL-compatible inputs
Logic Symbol
IEEE/IEC
n Standard Microcircuit Drawing (SMD)
— ’AC00: 5962-87549
— ’ACT00: 5962-87699
n 54AC00 now qualified to 300Krad RHA designation,
refer to the SMD for more information
Pin Names
An, Bn
On
Description
Inputs
Outputs
10025701
Connection Diagrams
Pin Assignment for
DIP and Flatpak
10025703
Pin Assignment
for LCC
10025702
FACT® is a registered trademark of Fairchild Semiconductor Corporation.
© 2003 National Semiconductor Corporation DS100257
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54AC00 Datasheet
Recommendation 54AC00 Datasheet
Part 54AC00
Description Quad 2-Input NAND Gate
Feature 54AC00; www.DataSheet4U.com 54AC00/54ACT00 Quad 2-Input NAND Gate July 2003 54AC00/54ACT00 Quad 2-Input N.
Manufacture National Semiconductor
Datasheet
Download 54AC00 Datasheet




National Semiconductor 54AC00
Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
Supply Voltage (VCC)
DC Input Diode Current (IIK)
VI = −0.5V
VI = VCC + 0.5V
DC Input Voltage (VI)
DC Output Diode Current (IOK)
VO = −0.5V
VO = VCC + 0.5V
DC Output Voltage (VO)
DC Output Source
or Sink Current (IO)
DC VCC or Ground Current
per Output Pin (ICC or IGND)
Storage Temperature (TSTG)
Junction Temperature (TJ)
CDIP
−0.5V to +7.0V
−20 mA
+20 mA
−0.5V to VCC +
0.5V
−20 mA
+20 mA
−0.5V to VCC +
0.5V
±50 mA
±50 mA
−65˚C to +150˚C
175˚C
Recommended Operating
Conditions
Supply Voltage (VCC)
’AC
’ACT
Input Voltage (VI)
Output Voltage (VO)
Operating Temperature (TA)
54AC/ACT
Minimum Input Edge Rate (V/t)
’AC Devices
VIN from 30% to 70% of VCC
VCC @ 3.3V, 4.5V, 5.5V
Minimum Input Edge Rate (V/t)
’ACT Devices
VIN from 0.8V to 2.0V
VCC @ 4.5V, 5.5V
2.0V to 6.0V
4.5V to 5.5V
0V to VCC
0V to VCC
−55˚C to +125˚C
125 mV/ns
125 mV/ns
Note 1: Absolute maximum ratings are those values beyond which damage
to the device may occur. The databook specifications should be met, without
exception, to ensure that the system design is reliable over its power supply,
temperature, and output/input loading variables. National does not recom-
mend operation of FACT® circuits outside databook specifications.
DC Characteristics for ’AC Family Devices
Symbol
Parameter
VIH Minimum High Level
Input Voltage
VIL Maximum Low Level
Input Voltage
VOH Minimum High Level
Output Voltage
54AC
VCC
TA =
(V) −55˚C to +125˚C
Guaranteed Limits
3.0 2.1
4.5 3.15
5.5 3.85
3.0 0.9
4.5 1.35
5.5 1.65
3.0 2.9
4.5 4.4
5.5 5.4
VOL Maximum Low Level
Output Voltage
3.0
4.5
5.5
3.0
4.5
5.5
2.4
3.7
4.7
0.1
0.1
0.1
IIN Maximum Input
Leakage Current
3.0 0.5
4.5 0.5
5.5 0.5
5.5 ±1.0
Units
Conditions
VOUT = 0.1V
V or VCC − 0.1V
VOUT = 0.1V
V or VCC − 0.1V
IOUT = −50 µA
V
(Note 2)
VIN = VIL or VIH
IOH = −12 mA
V IOH = −24 mA
IOH = −24 mA
IOUT = 50 µA
V
(Note 2)
VIN = VIL or VIH
IOL = 12 mA
V IOL = 24 mA
IOL = 24 mA
µA VI = VCC, GND
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National Semiconductor 54AC00
DC Characteristics for ’AC Family Devices (Continued)
Symbol
Parameter
IOLD
IOHD
ICC
Minimum Dynamic
Output Current (Note 4)
Maximum Quiescent
Supply Current
54AC
VCC
TA =
(V) −55˚C to +125˚C
Guaranteed Limits
5.5 50
5.5 −50
5.5 40.0
Note 2: All outputs loaded; thresholds on input associated with output under test.
Note 3: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C.
Note 4: Maximum test duration 2.0 ms, one output loaded at a time.
Note 5: IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
ICC for 54AC @ 25˚C is identical to 74AC @ 25˚C.
DC Characteristics for ’ACT Family Devices
Symbol
Parameter
VIH Minimum High Level
Input Voltage
VIL Maximum Low Level
Input Voltage
VOH Minimum High Level
Output Voltage
54ACT
VCC
TA =
(V) −55˚C to +125˚C
Guaranteed Limits
4.5 2.0
5.5 2.0
4.5 0.8
5.5 0.8
4.5 4.4
5.5 5.4
Units
mA
mA
µA
Units
V
V
V
VOL Maximum Low Level
Output Voltage
4.5
5.5
4.5
5.5
3.70
4.70
0.1
0.1
V
V
IIN
ICCT
IOLD
IOHD
ICC
Maximum Input
Leakage Current
Maximum
ICC/Input
Minimum Dynamic
Output Current (Note 7)
Maximum Quiescent
Supply Current
4.5
5.5
5.5
5.5
5.5
5.5
5.5
Note 6: All outputs loaded; thresholds on input associated with output under test.
Note 7: Maximum test duration 2.0 ms, one output loaded at a time.
Note 8: ICC for 54ACT @ 25˚C is identical to 74ACT @ 25˚C.
0.50
0.50
±1.0
1.6
50
−50
40.0
V
µA
mA
mA
mA
µA
Conditions
VOLD = 1.65V Max
VOHD = 3.85V Min
VIN = VCC
or GND
Conditions
VOUT = 0.1V
or VCC − 0.1V
VOUT = 0.1V
or VCC − 0.1V
IOUT = −50 µA
(Note 6)
VIN = VIL or VIH
IOH = −24 mA
IOH = −24 mA
IOUT = 50 µA
(Note 6)
VIN = VIL or VIH
IOL = 24 mA
IOL = 24 mA
VI = VCC, GND
VI = VCC − 2.1V
VOLD = 1.65V Max
VOHD = 3.85V Min
VIN = VCC
or GND
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