(K7Q161852A / K7Q163652A) 512Kx36 & 1Mx18 QDRTM b2 SRAM
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K7Q163652A K7Q161852A
Document Title
512Kx36-bit, 1Mx18-bit QDRTM SRAM
512Kx36 & 1Mx18 QDRTM b2 SR...
Description
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K7Q163652A K7Q161852A
Document Title
512Kx36-bit, 1Mx18-bit QDRTM SRAM
512Kx36 & 1Mx18 QDRTM b2 SRAM
Revision History
Rev. No. 0.0 0.1 History 1. Initial document. 1. Amendment 1) Page 3,4 PIN NAME DESCRIPTION W (4A) : from Read Control Pin to Write Control R (8A) : from Write Control Pin to Read Control BW0(7B),BW1(7A),BW2(5A),BW3(5B) : from Read Control Pin to Byte Wrtie Control 2) Page 7 STATE DIAGRAM from LEAD NOP to READ NOP 1. Amendment 1) Page 8 WRITE TRUTH TABLE(x36) BW2,BW3 values for WRITE ALL BYTEs( K↑ ) and WRITE ALLBYTEs( K↑ ) : from "H" to " L" 2) Page 13 TIMING WAVE FORMS Note 2 supplement 1. 1.8V I/O supply voltage addition 1) Page 2 FEATURES 2) Page 3,4 PIN NAME VDDQ 3) Page 10, OPERATING CONTITIONS 4) Page 11 AC TEST CONTITIONS 2. Amendment 1) Page 15 BOUNDARY SCAN ORDER EXIT 1. Icc, Isb addition 2. 1.8V Vddq addition 1. Reserved pin for high density name change from NC to Vss/SA 1. Final SPEC release 2. Modify thermal resistance Draft Date April, 30, 2001 May, 13, 2001 Remark Advance Advance
0.2
May, 26, 2001
Advance
0.3
June, 11, 2001
Advance
0.4
Sep,03, 2001 Nov, 30, 2001 July, 03. 2002
Advance Preliminary Final
0.5 1.0
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any questions, please contact the...
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