from Texas Instruments
SBOS393 – MARCH 2007
Current-Shunt Monitor with Dual Comparators
• COMPLETE CURRENT SENSE SOLUTION
• DUAL COMPARATORS:
– Comparator 1 with Latch
– Comparator 2 with Optional Delay
• COMMON-MODE RANGE: –16V to +80V
• HIGH ACCURACY: 3.5% (max) Over
• BANDWIDTH: 500kHz
• QUIESCENT CURRENT: 1.8mA
• PACKAGES: SO-14, TSSOP-14, MSOP-10
• NOTEBOOK COMPUTERS
• CELL PHONES
• TELECOM EQUIPMENT
• POWER MANAGEMENT
• BATTERY CHARGERS
• WELDING EQUIPMENT
CMP1 IN-/0.6V REF 3
CMP1 IN+ 4
CMP2 IN+ 5
CMP2 IN-/0.6V REF 6
12 1.2V REF OUT
11 CMP1 OUT
10 CMP2 OUT
9 CMP2 DELAY
8 CMP1 RESET
The INA203, INA204, and INA205 are a family of
unidirectional, current-shunt monitors with voltage
output, dual comparators, and voltage reference. The
INA203, INA204, and INA205 can sense drops
across shunts at common-mode voltages from –16V
to +80V. The INA203, INA204, and INA205 are
available with three output voltage scales: 20V/V,
50V/V, and 100V/V, with up to 500kHz bandwidth.
The INA203, INA204, and INA205 also incorporate
two open-drain comparators with internal 0.6V
references. On 14-pin versions, the comparator
references can be overridden by external inputs.
Comparator 1 includes a latching capability, and
Comparator 2 has a user-programmable delay.
14-pin versions also provide a 1.2V reference output.
The INA203, INA204, and INA205 operate from a
single +2.7V to +18V supply. They are specified over
the extended operating temperature range of –40°C
CMP1 IN+ 3
CMP2 IN+ 4
8 CMP1 OUT
7 CMP2 OUT
6 CMP1 RESET
Variant of INA203–INA205 Comparator 2 polarity
Current-shunt monitor with single Comparator
Current-shunt monitor only
Current-shunt monitor with split stages for filter
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Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
All trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2007, Texas Instruments Incorporated