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Output DAC. AD5570 Datasheet

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Output DAC. AD5570 Datasheet






AD5570 DAC. Datasheet pdf. Equivalent




AD5570 DAC. Datasheet pdf. Equivalent





Part

AD5570

Description

Serial Input Voltage Output DAC



Feature


True Accuracy, 16-Bit ±12 V/±15 V, Ser ial Input Voltage Output DAC AD5570 FEA TURES Full 16-bit performance 1 LSB max INL and DNL Output voltage range up to ±14 V On-board reference buffers, eli minating the need for a negative refere nce Controlled output during power-on T emperature range of −40°C to +85°C/ −40°C to +125°C Settling time of 10 µs to 0.003% Clear function .
Manufacture

Analog Devices

Datasheet
Download AD5570 Datasheet


Analog Devices AD5570

AD5570; to 0 V www.DataSheet4U.com Asynchronous update of outputs (LDAC pin) Power-on r eset Serial data output for daisy chain ing Data readback facility FUNCTIONAL BLOCK DIAGRAM VSS VDD DGND AD5570 REFG ND R R R POWER-ON RESET 16-BIT DAC V OUT AGND AGNDS R DAC REGISTER REFIN P OWER-DOWN CONTROL LOGIC PD 03760-0-001 LDAC SHIFT REGISTER APPLICATIONS In dustrial automatio.


Analog Devices AD5570

n Automatic test equipment Process contr ol Data acquisition systems General-pur pose instrumentation SDIN SCLK SYNC SDO CLR Figure 1. GENERAL DESCRIPTI ON The AD5570 is a single 16-bit serial input, voltage output DAC that operate s from supply voltages of ±12 V up to ±15 V. Integral linearity (INL) and di fferential nonlinearity (DNL) are accur ate to 1 LSB. During.


Analog Devices AD5570

power-up (when the supply voltages are changing), VOUT is clamped to 0 V via a low impedance path. The AD5570 DAC com es complete with a set of reference buf fers. The reference buffers allow a sin gle, positive reference to be used. The voltage on REFIN is gained up and inve rted internally to give the positive an d negative reference for the DAC core. Having the referen.

Part

AD5570

Description

Serial Input Voltage Output DAC



Feature


True Accuracy, 16-Bit ±12 V/±15 V, Ser ial Input Voltage Output DAC AD5570 FEA TURES Full 16-bit performance 1 LSB max INL and DNL Output voltage range up to ±14 V On-board reference buffers, eli minating the need for a negative refere nce Controlled output during power-on T emperature range of −40°C to +85°C/ −40°C to +125°C Settling time of 10 µs to 0.003% Clear function .
Manufacture

Analog Devices

Datasheet
Download AD5570 Datasheet




 AD5570
True Accuracy, 16-Bit ±12 V/±15 V,
Serial Input Voltage Output DAC
AD5570
FEATURES
Full 16-bit performance
1 LSB maximum INL and DNL
Output voltage range up to ±14 V
On-board reference buffers, eliminating the need for a
negative reference
Controlled output during power-on
Temperature ranges of −40°C to +85°C for A/B version/−40°C
to +125°C for W/Y version
Settling time of 10 μs to 0.003%
Clear function to 0 V
Asynchronous update of outputs (LDAC pin)
Power-on reset
Serial data output for daisy chaining
Data readback facility
5 kV HBM ESD classification
APPLICATIONS
Industrial automation
Automatic test equipment
Process control
Data acquisition systems
General-purpose instrumentation
GENERAL DESCRIPTION
The AD5570 is a single 16-bit serial input, voltage output DAC
that operates from supply voltages of ±11.4 V up to ±16.5 V.
Integral linearity (INL) and differential nonlinearity (DNL) are
accurate to 1 LSB. During power-up, when the supply voltages
are changing, VOUT is clamped to 0 V via a low impedance path.
The AD5570 DAC comes complete with a set of reference
buffers. The reference buffers allow a single, positive reference
to be used. The voltage on REFIN is gained up and inverted
internally to give the positive and negative reference for the
DAC core. Having the reference buffers on-chip eliminates the
need for external components such as inverters, precision
amplifiers, and resistors, thereby reducing the overall solution
size and cost.
The AD5570 uses a versatile 3-wire interface that is compatible
with SPI®, QSPI™, MICROWIRE™, and DSP® interface standards.
Data is presented to the part as a 16-bit serial word. Serial data
is available on the SDO pin for daisy-chaining purposes. Data
REFGND
REFIN
LDAC
FUNCTIONAL BLOCK DIAGRAM
VSS VDD DGND
AD5570
POWER-ON
RESET
2R 16-BIT
DAC
R
R
DAC REGISTER
VOUT
AGND
AGNDS
SHIFT REGISTER
POWER-DOWN
CONTROL LOGIC
PD
SDIN SCLK SYNC SDO
Figure 1.
CLR
readback allows the user to read the contents of the DAC
register via the SDO pin.
Features on the AD5570 include LDAC which is used to update
the output of the DAC. The device also has a power-down pin
(PD), allowing the DAC to be put into a low power state, and a
CLR pin that allows the output to be cleared to 0 V.
The AD5570 is available in a 16-lead SSOP.
PRODUCT HIGHLIGHTS
1. 1 LSB maximum INL and DNL.
2. Buffered voltage output up to ±14 V.
3. Output controlled during power-up.
4. On-board reference buffers.
5. Wide temperature range of 40°C to +125°C.
6. 5 kV HBM ESD classification.
Rev. C
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2010 Analog Devices, Inc. All rights reserved.




 AD5570
AD5570
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications....................................................................................... 1
Functional Block Diagram .............................................................. 1
General Description ......................................................................... 1
Product Highlights ........................................................................... 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Characteristics..................................................................... 5
Standalone ..................................................................................... 5
Timing Characteristics..................................................................... 6
Daisy-Chaining and Readback ................................................... 6
Absolute Maximum Ratings............................................................ 8
ESD Caution.................................................................................. 8
Pin Configuration and Function Descriptions............................. 9
Terminology .................................................................................... 10
Typical Performance Characteristics ........................................... 11
General Description ....................................................................... 16
REVISION HISTORY
11/10—Rev. B to Rev. C
Added HBM ESD Classification to Features and Product
Highlights Section ............................................................................ 1
Added ESD Parameter to Table 4 ................................................... 8
Changes to Ordering Guide .......................................................... 24
9/06—Rev. A to Rev. B
Updated Format..................................................................Universal
Changes to Table 3............................................................................ 6
Changes to Figure 43...................................................................... 21
Changes to AD5570 to 8xC51 Interface Section ........................ 21
Changes to Ordering Guide .......................................................... 24
4/05—Rev. 0 to Rev. A
Changes to Table 1............................................................................ 3
Changes to Table 4............................................................................ 8
Added Figure 16.............................................................................. 12
Revision 0: Initial Version
DAC Architecture....................................................................... 16
Reference Buffers........................................................................ 16
Serial Interface ............................................................................ 16
Transfer Function....................................................................... 17
Clear (CLR) ................................................................................. 17
Power-Down (PD) ..................................................................... 17
Power-On Reset.......................................................................... 17
Serial Data Output (SDO)......................................................... 17
Applications Information .............................................................. 19
Typical Operating Circuit ......................................................... 19
Layout Guidelines....................................................................... 20
Opto-Isolators............................................................................. 20
Microprocessor Interfacing....................................................... 21
Evaluation Board ........................................................................ 22
Outline Dimensions ....................................................................... 24
Ordering Guide .......................................................................... 24
Rev. C | Page 2 of 24




 AD5570
AD5570
SPECIFICATIONS
VDD = +11.4 V to +16.5 V, VSS = −11.4 V to −16.5 V, VREF = 5 V, REFGND = AGND = DGND = 0 V, RL = 5 kΩ, CL = 200 pF to AGND;
all specifications TMIN to TMAX, unless otherwise noted.
Table 1.
Parameter 1
ACCURACY
Resolution
Monotonicity
Differential Nonlinearity (DNL)
Relative Accuracy (INL)
B/Y Grade
A/W Grade
Positive INL Drift Over Time 3
A/B Grades
W/Y Grades
Negative Full-Scale Error
Full-Scale Error
Bipolar Zero Error
Gain Error
Gain Temperature Coefficient 4
REFERENCE INPUT
Reference Input Range4
Input Current
OUTPUT CHARACTERISTICS4
Output Voltage Range
Output Voltage Settling Time
Slew Rate
Digital-to-Analog Glitch Impulse
Bandwidth
Short Circuit Current
Output Noise Voltage Density
DAC Output Impedance
Digital Feedthrough
WARMUP TIME 5
LOGIC INPUTS
Input Currents
VINH, Input High Voltage
VINL, Input Low Voltage
CIN, Input Capacitance
LOGIC OUTPUTS
VOL, Output Low Voltage
Floating-State Output
Min
16
16
−1
−1
−2
4
4
VSS + 1.4
VSS + 2.5
2
Typ 2 Max
±0.3 +1
±0.4 +1
±0.6 +2
2.5
6.5
±0.9
±1.8
±0.9
±1.8
+0.25
±7.5
±6
±7.5
±7.5
±1.5
55
57
±0.1
VDD − 1.4
VDD − 2.5
12 16
10 13
67
6.5
15
20
25
85
0.35 0.5
0.5
12
±0.1
0.8
3
0.4
8
Unit Test Conditions/Comments
Bits
Bits
LSB
LSB
LSB
ppm
ppm
mV
mV
mV
mV
ppm FSR/°C
See Figure 16
V With ±11.4 V supplies
V With ±16.5 V supplies
μA
V
V
μs
μs
μs
V/μs
nV-s
kHz
mA
nV/Hz
Ω
nV-s
sec
With ±11.4 V supplies
With ±16.5 V supplies
At 16 bits to ±0.5 LSB
To 0.0003%
512 LSB code change
Measured from 10% to 90%
±12 V supplies; 1 LSB change around
the major carry
f = 1 kHz; midscale loaded
μA
V
V
pF
V ISINK = 1 mA
pF
Rev. C | Page 3 of 24



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