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CY7C1526KV18

Cypress Semiconductor

72-Mbit QDR-II SRAM Four-Word Burst Architecture

CY7C1526KV18 CY7C1513KV18 CY7C1515KV18 72-Mbit QDR® II SRAM Four-Word Burst Architecture 72-Mbit QDR® II SRAM Four-Word...


Cypress Semiconductor

CY7C1526KV18

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Description
CY7C1526KV18 CY7C1513KV18 CY7C1515KV18 72-Mbit QDR® II SRAM Four-Word Burst Architecture 72-Mbit QDR® II SRAM Four-Word Burst Architecture Features ■ Separate independent read and write data ports ❐ Supports concurrent transactions ■ 333 MHz clock for high bandwidth ■ Four-word burst for reducing address bus frequency ■ Double data rate (DDR) interfaces on both read and write ports (data transferred at 666 MHz) at 333 MHz ■ Two input clocks (K and K) for precise DDR timing ❐ SRAM uses rising edges only ■ Two input clocks for output data (C and C) to minimize clock skew and flight time mismatches ■ Echo clocks (CQ and CQ) simplify data capture in high speed systems ■ Single multiplexed address input bus latches address inputs for read and write ports ■ Separate port selects for depth expansion ■ Synchronous internally self-timed writes ■ QDR® II operates with 1.5 cycle read latency when DOFF is asserted HIGH ■ Operates similar to QDR I device with one cycle read latency when DOFF is asserted Low ■ Available in × 9, × 18, and × 36 configurations ■ Full data coherency, providing most current data ■ Core VDD = 1.8 V (±0.1 V); I/O VDDQ = 1.4 V to VDD ❐ Supports both 1.5 V and 1.8 V I/O supply ■ Available in 165-ball fine pitch ball grid array (FBGA) package (13 × 15 × 1.4 mm) ■ Offered in both Pb-free and non Pb-free packages ■ Variable drive HSTL output buffers ■ JTAG 1149.1 compatible test access port ■ Phase-locked loop (PLL) for accurate data placement Configurations CY7C152...




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