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K7A65D Dataheets PDF



Part Number K7A65D
Manufacturers Toshiba
Logo Toshiba
Description Silicon N-Channel MOSFET
Datasheet K7A65D DatasheetK7A65D Datasheet (PDF)

TK7A65D TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSⅦ) TK7A65D Switching Regulator Applications • Low drain-source ON-resistance: RDS (ON) = 0.8 Ω(typ.) • High forward transfer admittance: |Yfs| = 4.5 S (typ.) • Low leakage current: IDSS = 10 μA (max) (VDS = 650 V) • Enhancement mode: Vth = 2.0 to 4.0 V (VDS = 10 V, ID = 1 mA) Ф3.2 ± 0.2 10 ± 0.3 A Unit: mm 2.7 ± 0.2 3.9 3.0 15.0 ± 0.3 1.14 ± 0.15 2.8 MAX. 13 ± 0.5 Absolute Maximum Ratings (Ta = 25°C) 0.69 ± 0.15 Ф0.

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TK7A65D TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSⅦ) TK7A65D Switching Regulator Applications • Low drain-source ON-resistance: RDS (ON) = 0.8 Ω(typ.) • High forward transfer admittance: |Yfs| = 4.5 S (typ.) • Low leakage current: IDSS = 10 μA (max) (VDS = 650 V) • Enhancement mode: Vth = 2.0 to 4.0 V (VDS = 10 V, ID = 1 mA) Ф3.2 ± 0.2 10 ± 0.3 A Unit: mm 2.7 ± 0.2 3.9 3.0 15.0 ± 0.3 1.14 ± 0.15 2.8 MAX. 13 ± 0.5 Absolute Maximum Ratings (Ta = 25°C) 0.69 ± 0.15 Ф0.2 M A 2.6 ± 0.1 4.5 ± 0.2 Characteristics Drain-source voltage Gate-source voltage Drain current DC (Note 1) Pulse (Note 1) Drain power dissipation (Tc = 25°C) Single pulse avalanche energy (Note 2) Avalanche current Repetitive avalanche energy (Note 3) Channel temperature Storage temperature range Symbol VDSS VGSS ID IDP PD EAS IAR EAR Tch Tstg Rating 650 ±30 7 28 45 273 7 4.5 150 −55 to 150 Unit V V A W mJ A mJ °C °C 2.54 2.54 123 0.64 ± 0.15 1: Gate 2: Drain 3: Source JEDEC ⎯ JEITA SC-67 TOSHIBA 2-10U1B Weight: 1.7 g (typ.) Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Thermal Characteristics Characteristics Thermal resistance, channel to case Thermal resistance, channel to ambient Symbol Rth (ch-c) Rth (ch-a) Max 2.78 62.5 Unit °C/W °C/W Note 1:Ensure that the channel temperature does not exceed 150℃. Note 2: VDD = 90 V, Tch = 25°C (initial), L = 9.86mH, RG = 25 Ω, IAR = 7 A Note 3: Repetitive rating: pulse width limited by maximum channel temperature This transistor is an electrostatic-sensitive device. Handle with care. 1 2 3 Start of commercial production 2009-07 1 2013-11-01 Electrical Characteristics (Ta = 25°C) TK7A65D Characteristics Gate leakage current Drain cut-off current Drain-source breakdown voltage Gate threshold voltage Drain-source ON resistance Forward transfer admittance Input capacitance Reverse transfer capacitance Output capacitance Rise time Switching time Turn-on time Fall time Turn-off time Total gate charge Gate-source charge Gate-drain charge Symbol Test Condition Min IGSS IDSS V (BR) DSS Vth RDS (ON) |Yfs| Ciss Crss Coss VGS = ±30 V, VDS = 0 V VDS = 650 V, VGS = 0 V ID = 10 mA, VGS = 0 V VDS = 10 V, ID = 1 mA VGS = 10 V, ID = 3.5 A VDS = 10 V, ID = 3.5 A VDS = 25 V, VGS = 0 V, f = 1 MHz ⎯ ⎯ 650 2.0 ⎯ 1.1 ⎯ ⎯ ⎯ tr 10 V ID = 3.5 A VOUT ⎯ VGS 0V ton 50 Ω RL = 57 Ω ⎯ tf VDD ≈ 200 V toff Duty ≤ 1%, tw = 10 μs ⎯ ⎯ Qg ⎯ Qgs VDD ≈ .


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