OSCONSVPSERIES. 25SVP33M Datasheet

25SVP33M OSCONSVPSERIES. Datasheet pdf. Equivalent


SanyoSemiconDevice 25SVP33M
OS-CON 25SVP33M
OS-CON DATA SHEET
No.OS02N-DFSVP047
Frequency (kHz)
Impedance (ohm)
ESR (ohm)
0.12
38.917
0.361
0.5
9.405
0.145
1
4.720
0.110
10
0.496
0.060
100
0.067
0.026
500
0.020
0.018
1000
0.018
0.016
5000
0.085
0.018
10000
0.163
0.024
Frequency characteristics
1000
Impedance (ohm)
100 ESR (ohm)
10
1
0.1
0.01
0.001
0.1
1
10
100
1000
10000
Frequency (kHz)
Measureing equipment: HP4194A
Test fixture: HP16047C
Measuring position: root of leads
OS Engineering Department, OS-CON Control Department
Saga SANYO Industries Co., Ltd.
n = 3p.(Ave.)
Room temperature


25SVP33M Datasheet
Recommendation 25SVP33M Datasheet
Part 25SVP33M
Description OSCONSVPSERIES
Feature 25SVP33M; OS-CON DATA SHEET OS-CON 25SVP33M Frequency (kHz) Impedance (ohm) ESR (ohm) 0.12 38.917 0.361 0.5 9..
Manufacture SanyoSemiconDevice
Datasheet
Download 25SVP33M Datasheet




SanyoSemiconDevice 25SVP33M
OS-CON DATA SHEET
SVP series
Test item
Endurance
(After V.P.S test)
Test temperature
105 deg.C
Applied voltage
20V
Model
25SVP33M
Lot No.
0O1002541
Change in capacitance (120Hz)
20
10
0
-10
-20
-30
-40
0
Time[h]
2000
Tangent of loss angle (120Hz)
0.15
0.14
0.13
0.12
0.11
0.1
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
0
Time[h]
2000
100
90
80
70
60
50
40
30
20
10
0
0
ESR (100kHz)
Time[h]
2000
Leakage current (25V 60s)
10000
1000
100
10
1
0.1
0.01
0
Time[h]
2000
Note:
n =30p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S = Vapor Phase Soldering method)
Start on November 1, 2000
Executed by M. Koyama
End on January 23, 2001
Drawn by M. Kimura
No.OS02D-DESVP047
OS Engineering Department, OS-CON Control Department, Saga SANYO Industries Co., Ltd.



SanyoSemiconDevice 25SVP33M
OS-CON DATA SHEET
SVP series
Test item
Damp heat (Steady state)
(After V.P.S test)
Test temperature
60 deg.C
Test humidity
90% RH
Model
25SVP33M
Lot No.
0O1002541
Change in capacitance (120Hz)
20
10
0
-10
-20
-30
-40
0
Time[h]
1000
Tangent of loss angle (120Hz)
0.15
0.14
0.13
0.12
0.11
0.1
0.09
0.08
0.07
0.06
0.05
0.04
0.03
0.02
0.01
0
0
Time[h]
1000
100
90
80
70
60
50
40
30
20
10
0
0
ESR (100kHz)
Time[h]
1000
Leakage current (25V 60s)
10000
1000
100
10
1
0.1
0.01
0
Time[h]
1000
Note:
n =20p.
V.P.S test conditions : 230deg.C×75s×2times
(V.P.S = Vapor Phase Soldering method)
Start on November 1, 2000
Executed by M. Koyama
End on December 13, 2000
Drawn by M. Kimura
No.OS02D-DHSVP047
OS Engineering Department, OS-CON Control Department, Saga SANYO Industries Co., Ltd.







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