HCS74T

HCS74T Data Sheet July 1999 File Number 4615.1 Radiation Hardened Dual-D Flip-Flop with Set and Reset Intersil’s Satellite Applications FlowTM (SAF) devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability. The Intersil HCS74T is a Radiation Hardened Positive Edge Triggered Flip-Flop with set and reset. The HCS74T utilizes advanced CMOS/SOS technology to achieve high-speed operation. This device is a member of radiation hardened, high-speed, CMOS/SOS Logic Family. Features QML Class T, Per MIL-PRF-38535 Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions, SOS Process - SEP Effective LET No Upsets: >100 MEV-cm2/mg - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ) 3 Micron Radiation Hardened SOS CMOS Significant Power Reduction Compared to LSTTL ICs DC Operating Voltage Range: 4.5V to 5.5V Input Logic Levels - VIL = 30% of VCC Max - VIH = 70% of VCC Min Input Current Levels Ii ≤ 5µA at VOL, VOH Specifications Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed below must be used when ordering. Detailed Electrical Specifications for the HCS74T are contained in SMD 5962-95782. A “hot-link” is provided from our website for downloading. ...