HCTS109T

HCTS109T Data Sheet July 1999 File Number 4624.1 Radiation Hardened Dual JK Flip Flop Intersil’s Satellite Applications FlowTM (SAF) devices are fully tested and guaranteed to 100kRAD total dose. These QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability. The Intersil HCTS109T is a Radiation Hardened Dual JK Flip Flop with set and reset. The flip flop changes state with the positive transition of the clock (CP1 or CP2). Features QML Class T, Per MIL-PRF-38535 Radiation Performance - Gamma Dose (γ) 1 x 105 RAD(Si) - Latch-Up Free Under Any Conditions - SEP Effective LET No Upsets: >100 MEV-cm2/mg - Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ) 3 Micron Radiation Hardened SOS CMOS Significant Power Reduction Compared to LSTTL ICs DC Operating Voltage Range: 4.5V to 5.5V LSTTL Input Logic Compatibility - VIL = 0.8V Max - VIH = VCC/2 Min Input Current Levels Ii ≤ 5mA at VOL, VOH Specifications Specifications for Rad Hard QML devices are controlled by the Defense Supply Center in Columbus (DSCC). The SMD numbers listed below must be used when ordering. Detailed Electrical Specifications for the HCTS109T are contained in SMD 5962-95769. A “hot-link” is provided from our website for downloading. www.intersil.com/spacedefense/newsafclasst.asp Intersil’s Quality Management Plan (QM Plan), listing all Class T screenin...