HCTS374MS
August 1995
Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered
Features
Pinouts
3 Micron Radiation Hardened SOS CMOS
Total Dose 200K RAD (Si) SEP Effective LET No Upsets: >100 MEV-cm2/mg Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-
Day (Typ) Dose Rate Survivability: >1 x 1012 RAD (Si)/s Dose...
