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HCC4020B Dataheets PDF



Part Number HCC4020B
Manufacturers STMicroelectronics
Logo STMicroelectronics
Description Rad-hard 14-stage binary/ripple counter
Datasheet HCC4020B DatasheetHCC4020B Datasheet (PDF)

HCC40xxx, HCC45xxx Datasheet Rad-hard, high voltage, CMOS logic series Flat-14 Flat-16 DIL-14 DIL-16 Flat-24 DIL-24 The upper metallic lid is not electrically connected to any pins, nor to the IC die inside the package Product status link HCC40xxx, HCC45xxx Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperat.

  HCC4020B   HCC4020B


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HCC40xxx, HCC45xxx Datasheet Rad-hard, high voltage, CMOS logic series Flat-14 Flat-16 DIL-14 DIL-16 Flat-24 DIL-24 The upper metallic lid is not electrically connected to any pins, nor to the IC die inside the package Product status link HCC40xxx, HCC45xxx Features • ESCC qualified • 18 V Absolute maximum ratings • 3 V to 15 V operating voltage • Hermetic packages • Rad-hard 100 krad (Si) TID • SEL immune up to 119 MeV.cm²/mg • SEU immune up to 119 MeV.cm²/mg • -55 °C to +125 °C temperature range • ESCC specification available on ESCC website for each part Description The HCC40xxx and HCC45xxx series are composed of high-voltage CMOS functions, offering a set of highly noise tolerant gates, Flip-Flops, multiplexers, counters, bus interfaces, and several other functions. The radiation hardness, single event latch-up (SEL), single event upset (SEU) immunity, and the housing in hermetic packages of all types of both series make them usable in the most difficult environmental conditions. They are all qualified and tested over -55 °C to +125 °C ambiant temperature range. The complete specification of each type is available from the ESCC (European Space Components Coordination) web site: https://escies.org using its ESCC part number. STMicroelectronics® guarantees full compliance of qualified parts with these ESCC specifications. DS6709 - Rev 8 - November 2020 For further information contact your local STMicroelectronics sales office. www.st.com HCC40xxx, HCC45xxx Input equivalent circuit diagram 1 Input equivalent circuit diagram Figure 1. Inputand equivalent circuit diagram Note: For the HCC4019B and the HCC4050B input equivalent circuit, there is no diode connected to VCC. DS6709 - Rev 8 page 2/16 2 2.1 HCC40xxx, HCC45xxx Radiations Radiations Total ionizing dose All the devices of the HCC series are 100 krad guaranteed as per the test methods described in Table 1. TID test conditions for the CMOS4000B family. Table 1. TID test conditions for the CMOS4000B family Test parameter Test conditions Total dose 100 krad(Si) Dose rate 40 krad(Si)/h Sampling 4 biased parts by wafer on 3 wafer per diffusion lot plus 1 control part to qualify the wafer lot. In case one wafer fails, qualification is done wafer per wafer on 4 biased parts Bias conditions(1) Limits VDD = 10 V(2) inputs at VDD(3) VTHN, VTHP, IOL, IOH, TPHL, TPLH, VOL, VOH, VN, VP, VH: see “ESCC detail specifications”, limits ± 35% for high and low limits Others tests performed as defined in “ESCC detail specification” with corresponding limits 1. During irradiation. 2. VDD = 10 Volt has been demonstrated to be the worst case condition during characterization. 3. Whenever functionally pertinent. Figure 2. Irradiation test flow 1. The post rad guaranteed Vcc min. is therefore 5 V. DS6709 - Rev 8 page 3/16 HCC40xxx, HCC45xxx Single event effects (SEE) 2.2 Single event effects (SEE) The HCC logic series is characterized under heavy ions through four test vehicles, representative of all the products with the same functional specification as described in Table 2. HCC series, SEE class summary. The SEE class of each product is also provided in Table 2. HCC series, SEE class summary. The SEE performance of any HCC device of the series is the performance of the class it belongs to. Table 2. HCC series, SEE class summary Test vehicle HCC4014B HCC4017B HCC4093B HCC4020B SEE class 1 2 3 4 The SEE performance of each SEE class is provided in Table 3. SEE performance of SEE classes Type Class SEL 1, 2, 3, 4 1 2, 3 SEU 4 SET 1, 2, 3, 4 Table 3. SEE performance of SEE classes Conditions 125 °C, VCC=20 V, LET = 119 MeV.cm2/mg, ion range = 20 µm, 45 ° tilt 25 °C, LET = 61 MeV.cm2/mg, VCC=5 V, VIN=2.5 V ± 2.5 V, fIN=50 kHz, fCLOCK =500 kHz, VCC=15 V, VIN=7.5 V ± 7.5 V, fIN=100 kHz, fCLOCK =1 MHz, ion range = 20 µm, 45 ° tilt 25 °C, LET = 119 MeV.cm2/mg, VCC=5 V, VIN=2.5 V ± 2.5 V, fIN=50 kHz, fCLOCK =500 kHz, VCC=15 V, VIN=7.5 V ± 7.5 V, fIN=100 kHz, fCLOCK =1 MHz, ion range = 20 µm, 45 ° tilt 25 °C, LET = 36 MeV.cm2/mg, VCC=5 V, VIN=2.5 V ± 2.5 V, fIN=50 kHz, fCLOCK =500 kHz, VCC=15 V, VIN=7.5 V ± 7.5 V, fIN=100 kHz, fCLOCK =1 MHz, ion range = 20 µm, 45 ° tilt 25 °C, LET = 119 MeV.cm2/mg, Trigger = ± 50 mV VCC=5 V, VIN=2.5 V ± 2.5 V, fIN=50 kHz, VCC= 15 V, VIN= 7.5 V± 7.5 V, fIN=100 kHz Result No event LETth> 60 MeV.cm2/mg, σ sat = 8 x 10-6 cm2 No event LETth> 36 MeV.cm2/mg, σ sat = 1 x 10-4cm2 No event DS6709 - Rev 8 page 4/16 HCC40xxx, HCC45xxx Ordering information 3 Ordering information Table 4. Order codes Product name HCC4001B HCC4002B HCC40106B HCC40109B HCC4011B Description Rad-hard quad 2input NOR gate Rad-hard dual 4input NOR gate Rad-hard hex Schmitt trigger Rad-hard quad lowto-high voltage level shifter Rad-hard quad 2input NAND gate Commercial Product(1) HCC4001BDG HCC4001BDT HCC4001BK1 HCC4001BKG HCC4001BKT HCC4002BDG HCC4002BDT HCC4002BKG HCC4002BKT.


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