Document
TC4017BP/BF
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC4017BP,TC4017BF
TC4017BP/TC4017BF Decade Counter/Divider
TC4017BP/BF is decimal Johnson counter consisting of 5 stage D-type flip-flop equipped with the decoder to convert the output to decimal.
Depending on the number of count pulses fed to CLOCK or CLOCK INHIBIT one output among 10 output lines “Q0” through “Q9” becomes “H” level.
The counter advances its state at rising edge of CLOCK (CLOCK INHIBIT = “L”) or falling edge of CLOCK INHIBIT (CLOCK = “H”). RESET input to “H” level resets the counter to Q0 = “H” and Q1 through Q9 = “L” regardless of CLOCK and CLOCK INHIBIT.
Pin Assignment
TC4017BP TC4017BF
Weight DIP16-P-300-2.54A SOP16-P-300-1.27A
: 1.00 g (typ.) : 0.18 g (typ.)
Truth Table
CLOCKΔ *
Inputs
CLOCK INHIBITΔ
*
*H
L*
L
L
H
H
RESET
H L L L L L L
Selected Output
Q0 Qn (NC) Qn (NC) Qn + 1 Qn (NC) Qn (NC) Qn + 1
Δ: Level change
*: Don’t care
NC: No change carry out “H”........... Q0 to Q4 = “H”
“L” ........... Q5 to Q9 = “H”
1
Start of commercial production
1978-04 2014-03-01
Logic Diagram Timing Chart
TC4017BP/BF
2 2014-03-01
Absolute Maximum Ratings (Note)
TC4017BP/BF
Characteristics
Symbol
Rating
Unit
DC supply voltage Input voltage Output voltage DC input current Power dissipation Operating ambient temperature range Storage temperature range
VDD VIN VOUT IIN PD Topr Tstg
VSS − 0.5 to VSS + 20 VSS − 0.5 to VDD + 0.5 VSS − 0.5 to VDD + 0.5
±10 300 (DIP)/180 (SOP)
−40 to 85 −65 to 150
V V V mA mW °C °C
Note:
Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
Operating Ranges (VSS = 0 V) (Note)
Characteristics
Symbol
Test Condition
Min Typ. Max Unit
DC supply voltage Input voltage
VDD VIN
⎯ 3 ⎯ 18 V ⎯ 0 ⎯ VDD V
Note: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VDD or VSS.
3 2014-03-01
TC4017BP/BF
Static Electrical Characteristics (VSS = 0 V)
Characteristics
High-level output voltage
Low-level output voltage
Output high current
Output low current
Input high voltage
Input low voltage
Input current
“H” level “L” level
Quiescent supply current
Symbol VOH VOL
IOH
IOL
VIH
VIL IIH IIL IDD
Test Condition
VDD (V)
⎪IOUT⎪ < 1 μA VIN = VSS, VDD
5 10 15
⎪IOUT⎪ < 1 μA VIN.