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A675 Dataheets PDF



Part Number A675
Manufacturers NEC
Logo NEC
Description PNP SILICON TRANSISTOR
Datasheet A675 DatasheetA675 Datasheet (PDF)

DATA SHEET SILICON TRANSISTOR 2SA675 PNP SILICON EPITAXIAL TRANSISTOR FOR DRIVING FLUORESCENT INDICATOR PANNEL The 2SA675 is a resin sealed mold transistor and is ideal for dynamic drivers of counting indicator pannel such as fluorescent indicator pannel due to high voltage. • High voltage VCBO > −80 V, VCER > −80 V • Excellent linearity for current of DC current gain ABSOLUTE MAXIMUM RATINGS (Ta = 25°C) Parameter Collector to base voltage Collector to emitter voltage Emitter to base volta.

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DATA SHEET SILICON TRANSISTOR 2SA675 PNP SILICON EPITAXIAL TRANSISTOR FOR DRIVING FLUORESCENT INDICATOR PANNEL The 2SA675 is a resin sealed mold transistor and is ideal for dynamic drivers of counting indicator pannel such as fluorescent indicator pannel due to high voltage. • High voltage VCBO > −80 V, VCER > −80 V • Excellent linearity for current of DC current gain ABSOLUTE MAXIMUM RATINGS (Ta = 25°C) Parameter Collector to base voltage Collector to emitter voltage Emitter to base voltage Collector current Total power dissipation Junction temperature Storage temperature * RBE = 30 kΩ Symbol VCBO VCER * VEBO IC PT Tj Tstg Ratings −80 −80 −5.0 −100 250 125 −55 to +125 Unit V V V mA mW °C °C ELECTRICAL CHARACTERISTICS (Ta = 25°C) Parameter Collector cutoff current Emitter cutoff current DC current gain DC current gain Collector saturation voltage Base saturation voltage Gain bandwidth product Output capacitance Storage time Symbol ICBO IEBO hFE1 hFE2 VCE(sat) VBE(sat) fT Cob tstg Conditions VCB = –60 V, IE = 0 VEB = –3.0 V, IC = 0 VCE = –3.0 V, IC = –1.0 mA VCE = –3.0 V, IC = –20 mA IC = –20 mA, IB = –1.0 mA IC = –20 mA, IB = –1.0 mA VCE = –6.0 V, IE = 10 mA VCB = –10 V, IE = 0, f = 1.0 MHz Refer to the test circuit. PACKAGE DRAWING (UNIT: mm) MIN. 60 50 100 TYP. 120 120 −0.10 −0.74 170 4.5 0.5 MAX. −1.0 −1.0 300 −1.50 −1.20 10 1.0 Unit µA µA V V MHz pF µs The information in this document is subject to change without notice. Before using this document, please confirm that this is the latest version. Not all devices/types available in every country. Please check with local NEC representative for availability and additional information. Document No. D16146EJ3V0DS00 Date Published April 2002 N CP(K) Printed in Japan © 21090928 hFE CLASSIFICATION Marking hFE2 L 50 to 125 K 80 to 200 U 120 to 300 TYPICAL CHARACTERISTICS (Ta = 25°C) 2SA675 2 Data Sheet D16146EJ3V0DS 2SA675 SWITCHING TIME TEST CIRCUIT oscillo scope Data Sheet D16146EJ3V0DS 3 2SA675 • The information in this document is current as of July, 2001. The information is subject to change without notice. For actual design-in, refer to the latest publications of NEC's data sheets or data books, etc., for the most up-to-date specifications of NEC semiconductor products. Not all products and/or types are available in every country. Please check with an NEC sales representative for availability and additional information. • No part of this document may be copied or reproduced in any form or by any means without prior written consent of NEC. NEC assumes no responsibility for any errors that may appear in this document. • NEC does not assume any liability for infringement of patents, copyrights or other intellectual property rights of third parties by or arising from the use of NEC semiconductor products listed in this document or any other liability arising from the use of such products. No license, express, implied or otherwise, is granted under any patents, copyrights or other intellectual property rights of NEC or others. • Descriptions of circuits, software and other related information in this document are provided for illustrative purposes in semiconductor product operation and application examples. The incorporation of these circuits, software and information in the design of customer's equipment shall be done under the full responsibility of customer. NEC assumes no responsibility for any losses incurred by customers or third parties arising from the use of these circuits, software and information. • While NEC endeavours to enhance the quality, reliability and safety of NEC semiconductor products, customers agree and acknowledge that the possibility of defects thereof cannot be eliminated entirely. To minimize risks of damage to property or injury (including death) to persons arising from defects in NEC semiconductor products, customers must incorporate sufficient safety measures in their design, such as redundancy, fire-containment, and anti-failure features. • NEC semiconductor products are classified into the following three quality grades: "Standard", "Special" and "Specific". The "Specific" quality grade applies only to semiconductor products developed based on a customer-designated "quality assurance program" for a specific application. The recommended applications of a semiconductor product depend on its quality grade, as indicated below. Customers must check the quality grade of each semiconductor product before using it in a particular application. "Standard": Computers, office equipment, communications equipment, test and measurement equipment, audio and visual equipment, home electronic appliances, machine tools, personal electronic equipment and industrial robots "Special": Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster systems, anti-crime systems, safety equipment and medical equipment (not specifically designed for life support) "Specific": Aircraft, ae.


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