CCD5045

CCD5045 Time Delay Integration Line Scan Sensor FEATURES 4096 Active Pixels per Line 96 TDI Lines 13µm x 13µm Pixels 4 High Speed Output Ports TDI Stages Selectable Between 96, 64, 32, 16, or 4 132 MHz Data Rate with 4 Outputs Operating at 33 MHz 30.6 kHz Maximum Line Rate 2000X Antiblooming Protection High Sensitivity GENERAL DESCRIPTION The CCD5045 is a Time Delay Integration (TDI) sensor designed for a wide range of imaging applications requiring high speed operation combined with high sensitivity. The sensor is capable of producing a total data rate of 132 MHz (line rate > 30 kHz). The CCD has a total imaging area of 4096 contiguous elements by 96 TDI rows. The pixel dimensions are 13µm by 13µm. The CCD overall dimensions are 54.5 mm x 3.3 mm. The sensor is mounted in a custom 48-pin, 600 mil dual-in-line ceramic package. The CCD5045 imaging area is controlled by 3phase timing, and exposure control is performed by selecting the number of active TDI stages. Independent TDI control gates allow the following number of TDI stages to be selected: 96, 64, 32, 16, or 4. The CCD5045 features lateral antiblooming structures capable of 2000X over-saturation protection. The vertical (parallel) imaging register is separated from the horizontal (serial) registers by 50 isolation rows. The isolation rows are also controlled by 3-phase timing. The isolation rows are covered with a light shield and are used to transfer the charge from the imaging area to four horizonta...