Schmitt Trigger. 74AC132 Datasheet

74AC132 Trigger. Datasheet pdf. Equivalent

74AC132 Datasheet
Recommendation 74AC132 Datasheet
Part 74AC132
Description Quad 2-Input NAND Schmitt Trigger
Feature 74AC132; MC74AC132, MC74ACT132 Quad 2-Input NAND Schmitt Trigger High−Performance Silicon−Gate CMOS The MC7.
Manufacture ON Semiconductor
Datasheet
Download 74AC132 Datasheet




ON Semiconductor 74AC132
MC74AC132, MC74ACT132
Quad 2-Input NAND Schmitt
Trigger
High−Performance Silicon−Gate CMOS
The MC74AC/74ACT132 contains four 2−input NAND gates
which are capable of transforming slowly changing input signals into
sharply defined, jitter−free output signals. In addition, they have
greater noise margin than conventional NAND gates.
Each circuit contains a 2−input Schmitt trigger. The Schmitt trigger
uses positive feedback to effectively speed−up slow input transitions,
and provide different input threshold voltages for positive and
negative-going transitions. This hysteresis between the positive−going
and negative−going input threshold is determined by resistor ratios
and is essentially insensitive to temperature and supply voltage
variations.
Features
Schmitt Trigger Inputs
Outputs Source/Sink 24 mA
ACT132 Has TTL Compatible Inputs
These are Pb−Free Devices
VCC
14 13 12 11 10
9
8
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MARKING
DIAGRAM
14
14
1
SOIC−14
D SUFFIX
CASE 751A
xxx132G
AWLYWW
1
xxx = AC or ACT
A = Assembly Location
WL = Wafer Lot
Y = Year
WW = Work Week
G = Pb−Free Package
ORDERING INFORMATION
See detailed ordering and shipping information in the package
dimensions section on page 5 of this data sheet.
1234567
GND
Figure 1. Pinout; 14−Lead Packages Conductors
(Top View)
FUNCTION TABLE
Inputs
AB
LL
LH
HL
HH
H = HIGH Voltage Level
Output
Y
H
H
H
L
L = LOW Voltage Level
© Semiconductor Components Industries, LLC, 2015
January, 2015 − Rev. 8
1
Publication Order Number:
MC74AC132/D



ON Semiconductor 74AC132
MC74AC132, MC74ACT132
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VI
VO
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Sink/Source Current
DC Supply Current per Output Pin
DC Ground Current per Output Pin
Storage Temperature Range
Lead temperature, 1 mm from Case for 10 Seconds
Junction temperature under Bias
Thermal Resistance (Note 2)
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
(Note 1)
*0.5 to )7.0
*0.5 v VI v VCC )0.5
*0.5 v VO v VCC )0.5
$20
$50
$50
$50
$50
*65 to )150
260
)150
125
125
Level 1
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
mW
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 30% − 35%
Human Body Model (Note 3)
Machine Model (Note 4)
Charged Device Model (Note 5)
UL 94 V−0 @ 0.125 in
> 2000
> 200
> 1000
V
ILatch−Up Latch−Up Performance Above VCC and Below GND at 85°C (Note 6)
$100
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. IO absolute maximum rating must be observed.
2. The package thermal impedance is calculated in accordance with JESD51−7.
3. Tested to EIA/JESD22−A114−A.
4. Tested to EIA/JESD22−A115−A.
5. Tested to JESD22−C101−A.
6. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min Typ Max Unit
VCC Supply Voltage
AC
ACT
2.0 5.0 6.0
V
4.5 5.0 5.5
Vin, Vout DC Input Voltage, Output Voltage (Ref. to GND)
0
VCC
V
tr, tf
Input Rise and Fall Time (Note 1)
AC Devices except Schmitt Inputs
VCC @ 3.0 V
150
VCC @ 4.5 V
40
− ns/V
VCC @ 5.5 V
25
tr, tf
Input Rise and Fall Time (Note 2)
ACT Devices except Schmitt Inputs
VCC @ 4.5 V
10
ns/V
VCC @ 5.5 V
8.0
TJ Junction Temperature (PDIP)
− − 140 °C
TA Operating Ambient Temperature Range
−40 25
85 °C
IOH Output Current − High
− − −24 mA
IOL Output Current − Low
− − 24 mA
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
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ON Semiconductor 74AC132
MC74AC132, MC74ACT132
DC CHARACTERISTICS
74AC
74AC
Symbol
Parameter
VCC
(V)
TA = +25°C
TA =
−40°C to
+85°C
Unit
Conditions
Typ Guaranteed Limits
VOH Minimum High Level
Output Voltage
3.0 2.99 2.9
4.5 4.49 4.4
5.5 5.49 5.4
2.9
4.4
5.4
IOUT = −50 mA
V
3.0 − 2.56
4.5 − 3.86
5.5 − 4.86
2.46
3.76
4.76
*VIN = VIL or VIH
−12 mA
V IOH −24 mA
−24 mA
VOL Maximum Low Level
Output Voltage
3.0 0.002 0.1
4.5 0.001 0.1
5.5 0.001 0.1
0.1
0.1
0.1
IOUT = 50 mA
V
3.0 − 0.36
4.5 − 0.36
5.5 − 0.36
0.44
0.44
0.44
*VIN = VIL or VIH
V IOL
12 mA
24 mA
24 mA
IIN Maximum Input
Leakage Current
5.5 − ±0.1
±1.0
mA VI = VCC, GND
IOLD
IOHD
ICC
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
5.5 − −
5.5 − −
5.5 4.0
75
−75
40
mA VOLD = 1.65 V Max
mA VOHD = 3.85 V Min
mA VIN = VCC or GND
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
AC CHARACTERISTICS
Symbol
Parameter
tPLH Propagation Delay
tPHL Propagation Delay
*Voltage Range 3.3 V is 3.3 V ±0.3 V.
Voltage Range 5.0 V is 5.0 V ±0.5 V.
VCC*
(V)
3.3
5.0
3.3
5.0
74AC
TA = +25°C
CL = 50 pF
Min Typ Max
2.0 − 13.0
2.0 − 9.0
2.0 − 13.5
2.0 − 9.0
74AC
TA = −40°C
to +85°C
CL = 50 pF
Min Max
1.5 14.0
1.5 10.0
1.5 15.0
1.5 10.0
Unit
ns
ns
Fig.
No.
3−5
3−5
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