X7R Capacitors Datasheet 

Part Number  X7R 
Description  Capacitors 
Manufacture  AVX 
Total Page  4 Pages 
Datasheet 
X7R Dielectric
General Specifications
X7R formulations are called “temperature stable” ceramics and
fall into EIA Class II materials. X7R is the most popular of these
intermediate dielectric constant materials. Its temperature varia
tion of capacitance is within ±15% from 55°C to +125°C. This
capacitance change is nonlinear.
Capacitance for X7R varies under the influence of electrical op
erating conditions such as voltage and frequency.
X7R dielectric chip usage covers the broad spectrum of
industrial applications where known changes in capacitance
due to applied voltages are acceptable.
PART NUMBER (see page 2 for complete part number explanation)
0805
5
C 103 M A
T 2A
Size
Voltage
Dielectric
Capacitance Capacitance Failure
Terminations
(L" x W")
4V = 4
6.3V = 6
10V = Z
16V = Y
25V = 3
X7R = C
Code (In pF)
2 Sig. Digits +
Number of Zeros
Tolerance
J = ± 5%*
K = ±10%
M = ± 20%
Rate
A = Not
Applicable
T = Plated Ni
and Sn
7 = Gold Plated*
Z= FLEXITERM®**
50V = 5
*≤1μF only,
100V = 1
200V = 2
contact factory for
additional values
*Optional termination
500V = 7
**See FLEXITERM®
X7R section
NOTE: Contact factory for availability of Termination and Tolerance Options for Specific Part Numbers.
Contact factory for nonspecified capacitance values.
Packaging
2 = 7" Reel
4 = 13" Reel
7 = Bulk Cass.
9 = Bulk
Special
Code
A = Std. Product
Contact
Factory For
Multiples
X7R Dielectric�
Typical Temperature Coefficient
10
5
0
5
10
15
20
25
60 40 20 0 20 40 60 80 100 120 140
Temperature °C
Variation of Impedance with Cap Value�
Impedance vs. Frequency�
1,000 pF vs. 10,000 pF  X7R�
0805�
10.00
�
1,000 pF
10,000 pF
1.00
0.10
0.01
10
100
Frequency, MHz
1000
⌬ Capacitance vs. Frequency
+30
+20
+10
0
10
20
30
1KHz
10 KHz
100 KHz
Frequency
1 MHz
10 MHz
Insulation Resistance vs Temperature
10,000
1,000
100
0
0 20 40 60 80 100 120
Temperature °C
Variation of Impedance with Chip Size�
Impedance vs. Frequency�
10,000 pF  X7R�
�
10 � 1206
0805
1210
1.0
Variation of Impedance with Chip Size�
Impedance vs. Frequency�
100,000 pF  X7R�
10 �
� 1206
0805
1210
1.0
0.1
0.1
.01
1
.01
10 100 1,000 1
10 100 1,000
Frequency, MHz
Frequency, MHz
17

X7R Dielectric
Specifications and Test Methods
Parameter/Test
Operating Temperature Range
Capacitance
Dissipation Factor
Insulation Resistance
Dielectric Strength
Resistance to
Flexure
Stresses
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Solderability
Resistance to
Solder Heat
Thermal
Shock
Load Life
Load
Humidity
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
Appearance
Capacitance
Variation
Dissipation
Factor
Insulation
Resistance
Dielectric
Strength
X7R Specification Limits
55ºC to +125ºC
Within specified tolerance
≤ 2.5% for ≥ 50V DC rating
≤ 3.0% for 25V DC rating
≤ 3.5% for 25V and 16V DC rating
≤ 5.0% for ≤ 10V DC rating
100,000MΩ or 1000MΩ  μF,
whichever is less
No breakdown or visual defects
No defects
≤ ±12%
Meets Initial Values (As Above)
Measuring Conditions
Temperature Cycle Chamber
Freq.: 1.0 kHz ± 10%
Voltage: 1.0Vrms ± .2V
Charge device with rated voltage for
120 ± 5 secs @ room temp/humidity
Charge device with 300% of rated voltage for
15 seconds, w/charge and discharge current
limited to 50 mA (max)
Note: Charge device with 150% of rated
voltage for 500V devices.
Deflection: 2mm
Test Time: 30 seconds
1mm/sec
≥ Initial Value x 0.3
≥ 95% of each terminal should be covered
with fresh solder
No defects, <25% leaching of either end terminal
90 mm
Dip device in eutectic solder at 230 ± 5ºC
for 5.0 ± 0.5 seconds
≤ ±7.5%
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Dip device in eutectic solder at 260ºC for 60
seconds. Store at room temperature for 24 ± 2
hours before measuring electrical properties.
Meets Initial Values (As Above)
No visual defects
≤ ±7.5%
Step 1: 55ºC ± 2º
Step 2: Room Temp
30 ± 3 minutes
≤ 3 minutes
Meets Initial Values (As Above)
Meets Initial Values (As Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
No visual defects
≤ ±12.5%
≤ Initial Value x 2.0 (See Above)
≥ Initial Value x 0.3 (See Above)
Meets Initial Values (As Above)
Step 3: +125ºC ± 2º 30 ± 3 minutes
Step 4: Room Temp ≤ 3 minutes
Repeat for 5 cycles and measure after
24 ± 2 hours at room temperature
Charge device with 1.5 rated voltage (≤ 10V) in
test chamber set at 125ºC ± 2ºC
for 1000 hours (+48, 0)
Remove from test chamber and stabilize
at room temperature for 24 ± 2 hours
before measuring.
Store in a test chamber set at 85ºC ± 2ºC/
85% ± 5% relative humidity for 1000 hours
(+48, 0) with rated voltage applied.
Remove from chamber and stabilize at
room temperature and humidity for
24 ± 2 hours before measuring.
18

Features  X7R Dielectric General Specifications X 7R formulations are called “temperatu re stable” ceramics and fall into EIA Class II materials. X7R is the most po pular of these intermediate dielectric constant materials. Its temperature var iation of capacitance is within ±15% f rom 55°C to +125°C. This capacitance change is nonlinear. Capacitance for X7R varies under the influence of elect rical operating conditions such as volt age and frequency. X7R dielectric chip usage covers the broad spectrum of indu strial applications where known changes in capacitance due to applied voltages are acceptable. PART NUMBER (see page 2 for complete part number explanation ) 0805 5 C 103 M A T 2A Size Volt age Dielectric Capacitance Capacitanc e Failure Terminations (L" x W") 4V = 4 6.3V = 6 10V = Z 16V = Y 25V = 3 X 7R = C Code (In pF) 2 Sig. Digits + Nu mber of Zeros Tolerance J = ± 5%* K = ±10% M = ± 20% Rate A = Not Applica ble T = Plated Ni and Sn 7 = Gold Plated* Z= FLEXITERM®** 50V = 5 *≤1μ. 
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