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ADT7517-KGD Dataheets PDF



Part Number ADT7517-KGD
Manufacturers Analog Devices
Logo Analog Devices
Description SPI-/I2C-Compatible Temperature Sensor
Datasheet ADT7517-KGD DatasheetADT7517-KGD Datasheet (PDF)

Known Good Die SPI-/I2C-Compatible Temperature Sensor with 4-Channel ADC and Quad Voltage Output ADT7517-KGD FEATURES GENERAL DESCRIPTION Four 10-bit DACs Buffered voltage output Guaranteed monotonic by design over all codes 10-bit temperature-to-digital converter 10-bit, 4-channel ADC DC input bandwidth Input range: 0 V to 2.28 V Temperature range: −40°C to +120°C Temperature sensor accuracy: ±3°C typical Supply range: 2.7 V to 5.5 V DAC output range: 0 V to VDD The ADT7517-KGD combines a .

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Known Good Die SPI-/I2C-Compatible Temperature Sensor with 4-Channel ADC and Quad Voltage Output ADT7517-KGD FEATURES GENERAL DESCRIPTION Four 10-bit DACs Buffered voltage output Guaranteed monotonic by design over all codes 10-bit temperature-to-digital converter 10-bit, 4-channel ADC DC input bandwidth Input range: 0 V to 2.28 V Temperature range: −40°C to +120°C Temperature sensor accuracy: ±3°C typical Supply range: 2.7 V to 5.5 V DAC output range: 0 V to VDD The ADT7517-KGD combines a 10-bit temperature-to-digital converter, a 10-bit, 4-channel ADC, and a quad 10-bit DAC in die form. The ADT7517-KGD also includes a band gap temperature sensor and a 10-bit ADC to monitor and digitize the temperature reading to a resolution of 0.25°C. The ADT7517-KGD operates from a single 2.7 V to 5.5 V supply. The input voltage range on the ADC channels is 0 V to 2.28 V, and the input bandwidth is dc. The reference for the ADC channels is derived internally. The output voltage of the DAC ranges from 0 V to VDD, with an output voltage settling time of 7 μs typical. Power-down current: <10 μA The ADT7517-KGD provides two serial interface options: a 4-wire Internal 2.28 VREF option Double-buffered input logic serial interface that is compatible with SPI, QSPI™, MICROWIRE®, and DSP interface standards, and a 2-wire SMBus/I2C interface. Buffered reference input The ADT7517-KGD features a standby mode that is controlled Power-on reset to 0 V DAC output through the serial interface. Simultaneous update of outputs (LDAC function) On-chip, rail-to-rail output buffer amplifier Compatible with SPI, I2C, QSPI, MICROWIRE, and DSP Support for SMBus packet error checking (PEC) Known good die (KGD): a die that is tested and guaranteed over the full specifications of the data sheet APPLICATIONS Process control Smart battery chargers The reference for the four DACs is derived either internally or from a reference pad. The outputs of all DACs can be updated simultaneously using the software LDAC function or the external LDAC pad. The ADT7517-KGD incorporates a power-on reset circuit, ensuring that the DAC output powers up to 0 V and remains at 0 V until a valid write takes place. Additional application and technical information can be found in the ADT7517 data sheet. Portable equipment FUNCTIONAL BLOCK DIAGRAM D+/AIN1 D–/AIN2 LDAC/AIN3 AIN4 ON-CHIP TEMPERATURE SENSOR INTERNAL TEMPERATURE VALUE REGISTER EXTERNAL TEMPERATURE VALUE REGISTER ANALOG MUX VDD SENSOR ADC VDD VALUE REGISTER AIN1 VALUE REGISTER AIN2 VALUE REGISTER AIN3 VALUE REGISTER AIN4 VALUE REGISTER LIMIT COMPARATOR STATUS REGISTERS ADDRESS POINTER REGISTER THIGH LIMIT REGISTERS TLOW LIMIT REGISTERS VDD LIMIT REGISTERS AINHIGH LIMIT REGISTERS AINLOW LIMIT REGISTERS CONTROL CONFIG. 1 REGISTER CONTROL CONFIG. 2 REGISTER CONTROL CONFIG. 3 REGISTER DAC CONFIGURATION REGISTERS LDAC CONFIGURATION REGISTERS INTERRUPT MASK REGISTERS SPI/SMBus INTERFACE ADT7517-KGD DAC A STRING REGISTERS DAC A DAC B STRING REGISTERS DAC B DAC C STRING REGISTERS DAC C DAC D STRING REGISTERS DAC D GAIN SELECT LOGIC POWERDOWN LOGIC VOUT-A VOUT-B VOUT-C VOUT-D INT/INT INTERNAL REFERENCE DIGITAL MUX DIGITAL MUX 10686-001 VDD GND CS SCL/SCLK SDA/DIN DOUT/ADD Figure 1. LDAC/AIN3 VREF-IN Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarksandregisteredtrademarksarethepropertyoftheirrespectiveowners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2013–2014 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com ADT7517-KGD TABLE OF CONTENTS Features .............................................................................................. 1 Applications....................................................................................... 1 General Description ......................................................................... 1 Functional Block Diagram .............................................................. 1 Revision History ............................................................................... 2 Specifications..................................................................................... 3 DAC AC Characteristics.............................................................. 6 REVISION HISTORY 10/14—Rev. 0 to Rev. A Change to Bond Pad Composition Value, Table 6 ..................... 11 8/13—Revision 0: Initial Version Known Good Die Timing Diagrams ..........................................................................7 Absolute Maximum Ratings .......................................


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