UPD78P054

User’s Manual µPD78054, 78054Y SUBSERIES 8-BIT SINGLE-CHIP MICROCONTROLLERS µPD78052 µPD78053 µPD78054 µPD78P054 µPD78055 µPD78056 µPD78058 µPD78P058 µPD78052(A) µPD78053(A) µPD78054(A) µPD78052Y µPD78053Y µPD78054Y µPD78055Y µPD78056Y µPD78058Y µPD78P058Y Document No. U11747EJ5V0UM00 (5th edition) Date Published April 1998 N CP (K) © 1992 Printed in Japan [MEMO] 2 NOTES FOR CMOS DEVICES 1 PRECAUTION AGAINST ESD FOR SEMICONDUCTORS Note: Strong electric field, when exposed to a MOS device, can cause destruction of the gate oxide and ultimately degrade the device operation. Steps must be taken to stop generation of static electricity as much as possible, and quickly dissipate it once, when it has occurred. Environmental control must be adequate. When it is dry, humidifier should be used. It is recommended to avoid using insulators that easily build static electricity. Semiconductor devices must be stored and transported in an anti-static container, static shielding bag or conductive material. All test and measurement tools including work bench and floor should be grounded. The operator should be grounded using wrist strap. Semiconductor devices must not be touched with bare hands. Similar precautions need to be taken for PW boards with semiconductor devices on it. 2 HANDLING OF UNUSED INPUT PINS FOR CMOS Note: No connection for CMOS device inputs can be cause of malfunction. If no connection is provided to the input pins, it is possible that an internal input level may be...