NAND Gate. 74ACT00 Datasheet

74ACT00 Gate. Datasheet pdf. Equivalent

74ACT00 Datasheet
Recommendation 74ACT00 Datasheet
Part 74ACT00
Description Quad 2-Input NAND Gate
Feature 74ACT00; 74AC00, 74ACT00 — Quad 2-Input NAND Gate January 2008 74AC00, 74ACT00 Quad 2-Input NAND Gate Featu.
Manufacture Fairchild Semiconductor
Datasheet
Download 74ACT00 Datasheet





Fairchild Semiconductor 74ACT00
January 2008
74AC00, 74ACT00
Quad 2-Input NAND Gate
Features
ICC reduced by 50%
Outputs source/sink 24mA
ACT00 has TTL-compatible inputs
General Description
The AC00/ACT00 contains four, 2-input NAND gates.
Ordering Information
Order
Number
Package
Number
Package Description
74AC00SC
74AC00SJ
74AC00MTC
74AC00PC
74ACT00SC
74ACT00SJ
74ACT00MTC
74ACT00PC
M14A
M14D
MTC14
N14A
M14A
M14D
MTC14
N14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
Wide
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
Wide
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Device also available in Tape and Reel. Specify by appending suffix letter “X” to the ordering number.
All packages are lead free per JEDEC: J-STD-020B standard.
Connection Diagram
Logic Symbol
IEEE/IEC
Pin Description
Pin Names
An, Bn
On
Description
Inputs
Outputs
©1988 Fairchild Semiconductor Corporation
74AC00, 74ACT00 Rev. 1.4.1
www.fairchildsemi.com



Fairchild Semiconductor 74ACT00
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
VCC
IIK
VI
IOK
VO
IO
ICC or IGND
TSTG
TJ
Supply Voltage
DC Input Diode Current
VI = –0.5V
VI = VCC + 0.5
DC Input Voltage
DC Output Diode Current
VO = –0.5V
VO = VCC + 0.5V
DC Output Voltage
DC Output Source or Sink Current
DC VCC or Ground Current per Output Pin
Storage Temperature
Junction Temperature
Rating
–0.5V to +7.0V
–20mA
+20mA
–0.5V to VCC + 0.5V
–20mA
+20mA
–0.5V to VCC + 0.5V
±50mA
±50mA
–65°C to +150°C
140°C
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to absolute maximum ratings.
Symbol
VCC
VI
VO
TA
V / t
V / t
Parameter
Supply Voltage
AC
ACT
Input Voltage
Output Voltage
Operating Temperature
Minimum Input Edge Rate, AC Devices:
VIN from 30% to 70% of VCC, VCC @ 3.3V, 4.5V, 5.5V
Minimum Input Edge Rate, ACT Devices:
VIN from 0.8V to 2.0V, VCC @ 4.5V, 5.5V
Rating
2.0V to 6.0V
4.5V to 5.5V
0V to VCC
0V to VCC
–40°C to +85°C
125mV/ns
125mV/ns
©1988 Fairchild Semiconductor Corporation
74AC00, 74ACT00 Rev. 1.4.1
2
www.fairchildsemi.com



Fairchild Semiconductor 74ACT00
DC Electrical Characteristics for AC
Symbol
Parameter
VIH Minimum HIGH Level
Input Voltage
VIL Maximum LOW Level
Input Voltage
VOH Minimum HIGH Level
Output Voltage
VOL Maximum LOW Level
Output Voltage
IIN(3)
IOLD
IOHD
ICC(3)
Maximum Input
Leakage Current
Minimum Dynamic
Output Current(2)
Maximum Quiescent
Supply Current
VCC
(V)
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
3.0
4.5
5.5
5.5
Conditions
VOUT = 0.1V
or VCC – 0.1V
VOUT = 0.1V
or VCC – 0.1V
IOUT = –50µA
VIN = VIL or VIH,
IOH = –12mA
VIN = VIL or VIH,
IOH = –24mA
VIN = VIL or VIH,
IOH = –24mA(1)
IOUT = 50µA
VIN = VIL or VIH,
IOL = 12mA
VIN = VIL or VIH,
IOL = 24mA
VIN = VIL or VIH,
IOL = 24mA(1)
VI = VCC, GND
TA = +25°C TA = –40°C to +85°C
Typ.
Guaranteed Limits
1.5 2.1
2.1
2.25 3.15
3.15
2.75 3.85
3.85
1.5 0.9
0.9
2.25 1.35
1.35
2.75 1.65
1.65
2.99 2.9
2.9
4.49 4.4
4.4
5.49 5.4
5.4
2.56 2.46
Units
V
V
V
3.86 3.76
4.86 4.76
0.002
0.001
0.001
0.1
0.1
0.1
0.36
0.1
0.1
0.1
0.44
V
0.36 0.44
0.36 0.44
±0.1 ±1.0
µA
5.5 VOLD = 1.65V Max.
5.5 VOHD = 3.85V Min.
5.5 VIN = VCC or GND
2.0
75
–75
20.0
mA
mA
µA
Notes:
1. All outputs loaded; thresholds on input associated with output under test.
2. Maximum test duration 2.0ms, one output loaded at a time.
3. IIN and ICC @ 3.0V are guaranteed to be less than or equal to the respective limit @ 5.5V VCC.
©1988 Fairchild Semiconductor Corporation
74AC00, 74ACT00 Rev. 1.4.1
3
www.fairchildsemi.com





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