Graphical Data Test Circuits
TND308
Graphical Data Test Circuits for the NCP1651
Prepared by Alan Ball ON Semiconductor Applications Engineering
The...
Description
TND308
Graphical Data Test Circuits for the NCP1651
Prepared by Alan Ball ON Semiconductor Applications Engineering
The following circuits are the test configurations that were used to obtain the data for the graphical section of the NCP1651/D data sheet. Each graph has a schematic associated with it and in some cases a description of the procedure.
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APPLICATION NOTE
NCP1651 NCP1651
1.5 V
13
16
VCC Startup
11 AC Comp 8 FB/SD
10 Ref Fltr 9 AC Input
12 0.1 mF Vref Output 1 IS+ 5
Iavg
7 6
Iavg fltr
14 V 1 mF
+ 0–1 V
0.5 nF
Ramp
GND 2
CT Comp 34
4.7 k
470 pF
47 k
Figure 1. Current Sense Amplifier Gain Re: NCP1651/D data sheet, Figure 4
Energize all three power sources, beginning with the 14 volt supply. Cycle the 14 volt supply down to 8 volts and back to 14 to start unit operating. Adjust power supply on pin 5 and read voltages on pins 6 and 7.
13 12 0.1 mF
16
VCC Startup
8 FB/SD 11 AC Comp
R8 10 Ref Fltr 9 AC Input
Vref
Output IS+
1 5
Iavg
7 6
Iavg fltr
Ramp
GND
CT Comp
2 34
470 pF
47 k
14 V 1 mF
1 nF
Figure 2. FB/SD V–I Characteristics Re: NCP1651/D data sheet, Figure 5
Using a decade resistance box for R8, set it to 1 MW. Turn on the 14 volt source. Cycle it down to 8 volts and back up to 14 to turn the unit on. Read the voltage and pin 8 and note the resistance. Reduce R8 until the unit shuts down. Calculate the current for each reading.
© Semiconductor Components Industries, LLC, 2002
May, 2002 – Rev.0
1
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