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1N827 Dataheets PDF



Part Number 1N827
Manufacturers Motorola Inc
Logo Motorola  Inc
Description TEMPERATURECOMPENSATED SILICON ZENER REFERENCE DIODES 6.2 V/ 400 mW
Datasheet 1N827 Datasheet1N827 Datasheet (PDF)

MOTOROLA SEMICONDUCTOR TECHNICAL DATA Temperature-Compensated Zener Reference Diodes Temperature-compensated zener reference diodes utilizing a single chip oxide passivated junction for long-term voltage stability. A rugged, glass-enclosed, hermetically sealed structure. Mechanical Characteristics: CASE: Hermetically sealed, all-glass DIMENSIONS: See outline drawing. FINISH: All external surfaces are corrosion resistant and leads are readily solderable. POLARITY: Cathode indicated by polarity .

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MOTOROLA SEMICONDUCTOR TECHNICAL DATA Temperature-Compensated Zener Reference Diodes Temperature-compensated zener reference diodes utilizing a single chip oxide passivated junction for long-term voltage stability. A rugged, glass-enclosed, hermetically sealed structure. Mechanical Characteristics: CASE: Hermetically sealed, all-glass DIMENSIONS: See outline drawing. FINISH: All external surfaces are corrosion resistant and leads are readily solderable. POLARITY: Cathode indicated by polarity band. WEIGHT: 0.2 Gram (approx.) MOUNTING POSITION: Any Maximum Ratings Junction Temperature: – 55 to +175°C Storage Temperature: – 65 to +175°C DC Power Dissipation: 400 mW @ TA = 50°C WAFER FAB LOCATION: Phoenix, Arizona ASSEMBLY/TEST LOCATION: Phoenix, Arizona 1N821,A 1N823,A 1N825,A 1N827,A 1N829,A TEMPERATURECOMPENSATED SILICON ZENER REFERENCE DIODES 6.2 V, 400 mW CASE 299 DO-204AH GLASS ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted. VZ = 6.2 V ± 5%* @ IZT = 7.5 mA) (Note 5) Maximum Voltage Change ∆VZ (Volts) (Note 1) Ambient Test Temperature °C ±1°C Temperature Coefficient For Reference Only %/°C (Note 1) Maximum Dynamic Impedance ZZT Ohms (Note 2) JEDEC Type No. 1N821 1N823 1N825 1N827 1N829 0.096 0.048 0.019 0.009 0.005 – 55, 0, +25, +75, +100 0.01 0.005 0.002 0.001 0.0005 15 1N821A 1N823A 1N825A 1N827A 1N829A 0.096 0.048 0.019 0.009 0.005 0.01 0.005 0.002 0.001 0.0005 10 *Tighter-tolerance units available on special request. Motorola TVS/Zener Device Data 6.2 Volt OTC 400 mW DO-35 Data Sheet 8-159 1N821,A 1N823,A 1N825,A 1N827,A 1N829,A MAXIMUM VOLTAGE CHANGE versus AMBIENT TEMPERATURE (with IZT = 7.5 mA ±0.01 mA) (See Note 3) 1N821 through 1N829 25 1N821,A 20 15 1N823,A 10 25 1N825,A 1N827,A 0 1N829,A 1N827,A –25 –50 ∆VZ = –31 mV 1N825,A –10 1N823,A –15 –20 1N821,A –10 –55 0 0 50 100 1N821,A –25 –55 TA, AMBIENT TEMPERATURE (°C) 1N825,A 1N823,A 0 50 100 5 0 –5 1N829,A 1N827,A 1N827,A 1N829,A 1N823,A 1N825,A 100 IZT = 7.5 mA 75 ∆ VZ , MAXIMUM VOLTAGE CHANGE (mV) (Referenced to –55 ° C) 50 ∆VZ = +31 mV 1N821,A –75 Figure 1a Figure 1b ZENER CURRENT versus MAXIMUM VOLTAGE CHANGE (At Specified Temperatures) (See Note 4) MORE THAN 95% OF THE UNITS ARE IN THE RANGES INDICATED BY THE CURVES. 10 9 I Z , ZENER CURRENT (mA) 8 7.5 7 6 5 4 –75 –55°C +100°C I Z , ZENER CURRENT (mA) +25°C 10 9 8 7.5 7 6 5 4 –75 +25°C –55°C IZT +100°C IZT +100°C +25°C –55°C +100°C +25°C –55°C –50 –25 0 25 50 –50 –25 0 25 50 ∆VZ, MAXIMUM VOLTAGE CHANGE (mV) (Referenced to IZT = 7.5 mA) ∆VZ, MAXIMUM VOLTAGE CHANGE (mV) (Referenced to IZT = 7.5 mA) Figure 2. 1N821 Series Figure 3. 1N821A Series Devices listed in bold, italic are Motorola preferred devices. 6.2 Volt OTC 400 mW DO-35 Data Sheet 8-160 Motorola TVS/Zener Device Data 1N821,A 1N823,A 1N825,A 1N827,A 1N829,A MAXIMUM ZENER IMPEDANCE versus ZENER CURRENT (See Note 2) MORE THAN 95% OF THE UNITS ARE IN THE RANGES INDICATED BY THE CURVES. ZZ , MAXIMUM ZENER IMPEDANCE (OHMS) 1000 800 600 400 200 100 80 60 40 20 10 8 6 4 2 1 1 2 4 6 8 10 20 40 60 80 100 IZ, ZENER CURRENT (mA) –55°C 100°C 25°C ZZ , MAXIMUM ZENER IMPEDANCE (OHMS) 1000 800 600 400 200 100 80 60 40 20 10 8 6 4 2 1 1 2 4 6 8 10 20 40 60 80 100 IZ, ZENER CURRENT (mA) 25°C 100°C –55°C Figure 4. 1N821 Series Figure 5. 1N821A Series NOTE 1. VOLTAGE VARIATION (∆VZ) AND TEMPERATURE COEFFICIENT All reference diodes are characterized by the “box method.” This guarantees a maximum voltage variation (∆VZ) over the specified temperature range, at the specified test current (IZT), verified by tests at indicated temperature points within the range. VZ is measured and recorded at each temperature specified. The ∆VZ between the highest and lowest values must not exceed the maximum ∆VZ given. This method of indicating voltage stability is now used for JEDEC registration as well as for military qualification. The former method of indicating voltage stability — by means of temperature coefficient accurately reflects the voltage deviation at the temperature extremes, but is not necessarily accurate within the temperature range because reference diodes have a nonlinear temperature relationship. The temperature coefficient, therefore, is given only as a reference. NOTE 3. These graphs can be used to determine the maximum voltage change of any device in the series over any specific temperature range. For example, a temperature change from 0 to +50°C will cause a voltage change no greater than +31 mV or – 31 mV for 1N821 or 1N821A, as illustrated by the dashed lines in Figure 1. The boundaries given are maximum values. For greater resolution, an expanded view of the center area in Figure 1a is shown in Figure 1b. NOTE 4. The maximum voltage change, ∆VZ, Figures 2 and 3 is due entirely to the impedance of the device. If both temperature and IZT are varied, then the total voltage change may be obtained by graphically adding ∆VZ in Figure 2 or 3 to the ∆VZ in Figure 1 for the d.


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