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2N5089 Data Sheet

Small Signal Low Noise Transistors

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2N5089
Small Signal Low Noise Transistors (NPN) 2N5088/2N5089 Small Signal Low Noise Transistors (NPN) Features • NPN silicon epitaxial transistor for switching and amplifier applications • This device is designed for low noise, high gain, general purpose applications at collector currents from 1µA to 50mA • RoHS compliance Mechanical Data Case: Terminals: Weight: TO-92, Plastic Package Solderable per MIL-STD-202G, Method 208 0.18 gram TO-92 Absolute Maximum Ratings* (T Ambient=25ºC unless noted otherwise) Symbol Description 2N5088 2N5089 Unit VCEO VCBO VEBO IC TJ ,TSTG Collector-Emitter Voltage Collector-Base Voltage Emitter-Base Voltage Collector Current Continuous Operation and Storage Junction Temperature Range 30 25 35 30 4.5 100 -55 to +150 V V V mA °C * These ratings are limiting values above which the serviceability of any semiconductor device may be impaired. Notes 1. These ratings are based on a maximum junction temperature of 150 degrees C. 2. These ar.


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2N5089

2N5089

Download 2N5089 Datasheet
Small Signal Low Noise Transistors (NPN) 2N5088/2N5089 Small Signal Low Noise Transistors (NPN) Features • NPN silicon epitaxial transistor for switching and amplifier applications • This device is designed for low noise, high gain, general purpose applications at collector currents from 1µA to 50mA • RoHS compliance Mechanical Data Case: Terminals: Weight: TO-92, Plastic Package Solderable per MIL-STD-202G, Method 208 0.18 gram TO-92 Absolute Maximum Ratings* (T Ambient=25ºC unless noted otherwise) Symbol Description 2N5088 2N5089 Unit VCEO VCBO VEBO IC TJ ,TSTG Collector-Emitter Voltage Collector-Base Voltage Emitter-Base Voltage Collector Current Continuous Operation and Storage Junction Temperature Range 30 25 35 30 4.5 100 -55 to +150 V V V mA °C * These ratings are limiting values above which the serviceability of any semiconductor device may be impaired. Notes 1. These ratings are based on a maximum junction temperature of 150 degrees C. 2. These ar.


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